View source for INSPECTION SYSTEM, INSPECTION APPARATUS, CONTROL METHOD OF INSPECTION SYSTEM, AND CONTROL METHOD OF INSPECTION APPARATUS: abstract simplified (18296300)

*This abstract for appeared for patent application  number 18296300 Titled 'INSPECTION SYSTEM, INSPECTION APPARATUS, CONTROL METHOD OF INSPECTION SYSTEM, AND CONTROL METHOD OF INSPECTION APPARATUS'

==Simplified Explanation==

The abstract describes an inspection apparatus that includes controllers with processors and memories. The controllers can receive an image to be registered as a reference image and an inspection setting for that image. The inspection setting can be stored in a storage device. When a scan image of a printed matter is received, the inspection unit inspects the scan image based on the stored inspection setting. If a predetermined setting is received, the inspection setting associated with that predetermined setting is reflected in the reference image.


==Original Abstract Submitted==

An inspection apparatus includes one or more controllers having one or more processors and one or more memories, the one or more controllers configured to function as a receiving unit configured to receive an image to be registered as a reference image, a reception unit configured to receive an inspection setting for the received reference image, a storage unit configured to store an inspection setting in a storage device, and an inspection unit configured to, if a scan image obtained by scanning of a printed matter is received, inspect the scan image based on the inspection setting, wherein, in a case where a predetermined setting is received by the reception unit, an inspection setting associated with the predetermined setting stored by the storage unit is reflected in the reference image.