INSPECTION SYSTEM, INSPECTION APPARATUS, CONTROL METHOD OF INSPECTION SYSTEM, AND CONTROL METHOD OF INSPECTION APPARATUS: abstract simplified (18296300)

• This abstract for appeared for patent application number 18296300 Titled 'INSPECTION SYSTEM, INSPECTION APPARATUS, CONTROL METHOD OF INSPECTION SYSTEM, AND CONTROL METHOD OF INSPECTION APPARATUS'

Simplified Explanation

The abstract describes an inspection apparatus that includes controllers with processors and memories. The controllers can receive an image to be registered as a reference image and an inspection setting for that image. The inspection setting can be stored in a storage device. When a scan image of a printed matter is received, the inspection unit inspects the scan image based on the stored inspection setting. If a predetermined setting is received, the inspection setting associated with that predetermined setting is reflected in the reference image.

Original Abstract Submitted

An inspection apparatus includes one or more controllers having one or more processors and one or more memories, the one or more controllers configured to function as a receiving unit configured to receive an image to be registered as a reference image, a reception unit configured to receive an inspection setting for the received reference image, a storage unit configured to store an inspection setting in a storage device, and an inspection unit configured to, if a scan image obtained by scanning of a printed matter is received, inspect the scan image based on the inspection setting, wherein, in a case where a predetermined setting is received by the reception unit, an inspection setting associated with the predetermined setting stored by the storage unit is reflected in the reference image.