Difference between revisions of "Hitachi High-Tech Corporation patent applications published on March 21st, 2024"
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| + | '''Summary of the patent applications from Hitachi High-Tech Corporation on March 21st, 2024''' | ||
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| + | Hitachi High-Tech Corporation has recently filed patents for a defect inspection device with an inclined optical axis and imaging sensor, a plasma processing device designed to suppress plasma diffusion, a system for predicting patient sample collection call times using machine learning, and a method for washing a flow path in an auto sampler. | ||
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| + | Summary of notable applications: | ||
| + | * Semiconductor manufacturing | ||
| + | * Quality control in production lines | ||
| + | * Surface inspection in research and development | ||
| + | * Plasma etching processes | ||
| + | * Healthcare settings | ||
| + | * Laboratories | ||
| + | * Pharmaceutical research | ||
| + | * Environmental testing | ||
| + | * Food safety monitoring. | ||
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==Patent applications for Hitachi High-Tech Corporation on March 21st, 2024== | ==Patent applications for Hitachi High-Tech Corporation on March 21st, 2024== | ||
Latest revision as of 08:17, 27 March 2024
Summary of the patent applications from Hitachi High-Tech Corporation on March 21st, 2024
Hitachi High-Tech Corporation has recently filed patents for a defect inspection device with an inclined optical axis and imaging sensor, a plasma processing device designed to suppress plasma diffusion, a system for predicting patient sample collection call times using machine learning, and a method for washing a flow path in an auto sampler.
Summary of notable applications:
- Semiconductor manufacturing
- Quality control in production lines
- Surface inspection in research and development
- Plasma etching processes
- Healthcare settings
- Laboratories
- Pharmaceutical research
- Environmental testing
- Food safety monitoring.
Contents
- 1 Patent applications for Hitachi High-Tech Corporation on March 21st, 2024
- 1.1 Automatic Analyzer (18274759)
- 1.2 Mobile Robot (18272759)
- 1.3 AUTOMATIC ANALYZER AND AUTOMATIC ANALYSIS METHOD (18259810)
- 1.4 ELECTROLYTE ANALYZER (18276157)
- 1.5 Specimen Transportation Device (18266662)
- 1.6 FLOW PATH WASHING METHOD OF AUTO SAMPLER AND FLOW PATH WASHING APPARATUS OF AUTO SAMPLER (18038273)
- 1.7 SAMPLE COLLECTION CALL TIME PREDICTION SYSTEM AND METHOD (18275571)
- 1.8 PLASMA PROCESSING DEVICE (17641538)
- 1.9 DEFECT INSPECTION DEVICE (18272859)
Patent applications for Hitachi High-Tech Corporation on March 21st, 2024
Automatic Analyzer (18274759)
Main Inventor
Tsukasa SUENARI
Mobile Robot (18272759)
Main Inventor
Toshifumi MITSUYAMA
AUTOMATIC ANALYZER AND AUTOMATIC ANALYSIS METHOD (18259810)
Main Inventor
Hikaru Karo
ELECTROLYTE ANALYZER (18276157)
Main Inventor
Takushi MIYAKAWA
Specimen Transportation Device (18266662)
Main Inventor
Hiroyuki KOBAYASHI
FLOW PATH WASHING METHOD OF AUTO SAMPLER AND FLOW PATH WASHING APPARATUS OF AUTO SAMPLER (18038273)
Main Inventor
Yushi HARADA
SAMPLE COLLECTION CALL TIME PREDICTION SYSTEM AND METHOD (18275571)
Main Inventor
Kenichi TAKAHASHI
PLASMA PROCESSING DEVICE (17641538)
Main Inventor
Koichi Takasaki
DEFECT INSPECTION DEVICE (18272859)
Main Inventor
Hiromichi YAMAKAWA
