Hitachi High-Tech Corporation patent applications published on March 21st, 2024

Summary of the patent applications from Hitachi High-Tech Corporation on March 21st, 2024

Hitachi High-Tech Corporation has recently filed patents for a defect inspection device with an inclined optical axis and imaging sensor, a plasma processing device designed to suppress plasma diffusion, a system for predicting patient sample collection call times using machine learning, and a method for washing a flow path in an auto sampler.

Summary of notable applications:

• Semiconductor manufacturing
• Quality control in production lines
• Surface inspection in research and development
• Plasma etching processes
• Healthcare settings
• Laboratories
• Pharmaceutical research
• Environmental testing
• Food safety monitoring.

Patent applications for Hitachi High-Tech Corporation on March 21st, 2024

Automatic Analyzer (18274759)

Main Inventor

Tsukasa SUENARI

Mobile Robot (18272759)

Main Inventor

Toshifumi MITSUYAMA

AUTOMATIC ANALYZER AND AUTOMATIC ANALYSIS METHOD (18259810)

Main Inventor

Hikaru Karo

ELECTROLYTE ANALYZER (18276157)

Main Inventor

Takushi MIYAKAWA

Specimen Transportation Device (18266662)

Main Inventor

Hiroyuki KOBAYASHI

FLOW PATH WASHING METHOD OF AUTO SAMPLER AND FLOW PATH WASHING APPARATUS OF AUTO SAMPLER (18038273)

Main Inventor

Yushi HARADA

SAMPLE COLLECTION CALL TIME PREDICTION SYSTEM AND METHOD (18275571)

Main Inventor

Kenichi TAKAHASHI

PLASMA PROCESSING DEVICE (17641538)

Main Inventor

Koichi Takasaki

DEFECT INSPECTION DEVICE (18272859)

Main Inventor

Hiromichi YAMAKAWA