20240055247. OFF-AXIS ION EXTRACTION AND SHIELD GLASS ASSEMBLIES FOR SAMPLE ANALYSIS SYSTEMS simplified abstract (Exum Instruments)
OFF-AXIS ION EXTRACTION AND SHIELD GLASS ASSEMBLIES FOR SAMPLE ANALYSIS SYSTEMS
Organization Name
Inventor(s)
Jeffrey Williams of Denver CO (US)
Peyton Mackenzie Willis of Denver CO (US)
Oleg Maltsev of Albuquerque NM (US)
Jonathan C. Putman of Denver CO (US)
Nathan Kaiser of Brier WA (US)
Cole Naymark of Englewood CO (US)
OFF-AXIS ION EXTRACTION AND SHIELD GLASS ASSEMBLIES FOR SAMPLE ANALYSIS SYSTEMS - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240055247 titled 'OFF-AXIS ION EXTRACTION AND SHIELD GLASS ASSEMBLIES FOR SAMPLE ANALYSIS SYSTEMS
Simplified Explanation
The system described in the patent application includes a sample chamber, an aperture plate with an aperture aligned with a sample location, a first laser source to produce material from the sample, a second laser source to produce ionized material from the material cloud, an ion extractor assembly with a switchable ion extraction path, and a mass spectrometer.
- The system utilizes two laser sources to create and ionize material from a sample.
- The ion extractor assembly can switch between a rejection state and an acceptance state to control the flow of ions.
- The mass spectrometer analyzes the ionized material produced by the second laser source.
---
- Potential Applications
- Analytical chemistry
- Environmental monitoring
- Pharmaceutical research
- Problems Solved
- Efficient ion extraction
- Precise analysis of ionized material
- Controlling the flow of ions
- Benefits
- Improved accuracy in material analysis
- Enhanced ion extraction efficiency
- Versatile applications in various fields
Original Abstract Submitted
a system includes a sample chamber, an aperture plate defining an aperture having an aperture axis aligned with a sample location within the sample chamber. the system further includes a first laser source to produce a cloud of material from a sample and a second laser source configured to produce ionized material from the cloud of material. the system also includes an ion extractor assembly defining an ion extraction path and a mass spectrometer in communication with the ion extractor assembly. the ion extractor assembly is switchable between a rejection state in which the ion extractor assembly generates a rejection field to direct ions of the cloud of material away from the ion extractor inlet, and an acceptance state in which the ion extractor assembly generates an acceptance field to direct ionized material produced by the second beam along the ion extraction path.
