20240022283.Electronic Device with Couplers for Power Wave Detection in Multiple Reference Planes simplified abstract (apple inc.)
Contents
- 1 Electronic Device with Couplers for Power Wave Detection in Multiple Reference Planes
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 Electronic Device with Couplers for Power Wave Detection in Multiple Reference Planes - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
Electronic Device with Couplers for Power Wave Detection in Multiple Reference Planes
Organization Name
Inventor(s)
Lucas Calderin of San Francisco CA (US)
Zhengan Yang of Del Mar CA (US)
Electronic Device with Couplers for Power Wave Detection in Multiple Reference Planes - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240022283 titled 'Electronic Device with Couplers for Power Wave Detection in Multiple Reference Planes
Simplified Explanation
The abstract describes an electronic device with signal transmission circuitry that includes signal couplers for measuring signals at different reference planes. The signal couplers can be adjusted to shift the reference planes dynamically.
- The electronic device includes signal transmission circuitry with signal couplers for measuring signals at different reference planes.
- The signal couplers can be adjusted to shift the reference planes dynamically.
- Measurements may include power wave, forward wave, reverse wave, impedance, and/or delivered power.
- The signal couplers are formed from metallization layers on a stacked dielectric substrate.
- Additional signal couplers can be added to measure more reference planes concurrently.
Potential Applications
This technology could be applied in telecommunications, radar systems, and other electronic devices where precise signal measurements are required.
Problems Solved
This technology solves the problem of accurately measuring signals at different reference planes in electronic devices without the need for manual adjustments.
Benefits
The benefits of this technology include improved accuracy in signal measurements, increased efficiency in signal testing, and the ability to dynamically adjust reference planes.
Potential Commercial Applications
Potential commercial applications of this technology could include test and measurement equipment for electronics manufacturing, signal analysis tools for telecommunications companies, and radar systems for defense applications.
Possible Prior Art
One possible prior art for this technology could be signal measurement devices with fixed reference planes that require manual adjustments for accurate measurements.
Unanswered Questions
How does the dynamic adjustment of reference planes improve signal measurements in electronic devices?
The dynamic adjustment of reference planes allows for more accurate and precise signal measurements at different points along the signal path, leading to improved overall performance of the electronic device.
What are the limitations of using signal couplers for measuring signals at multiple reference planes?
One limitation of using signal couplers for measuring signals at multiple reference planes is the potential for signal interference or distortion due to the additional components in the signal path. This could affect the accuracy of the measurements and require careful calibration to minimize errors.
Original Abstract Submitted
an electronic device may include signal transmission circuitry having a signal path and a signal source that transmits a signal on the signal path. first and second signal couplers may be coupled to the signal path. control circuitry may use the first signal coupler to measure the signal at a first reference plane and may use the second signal coupler to concurrently measure the signal at a second reference plane. the signal measurements may include power wave, forward wave, reverse wave, impedance, and/or delivered power measurements. terminations in the signal couplers may be adjusted to dynamically shift the reference planes. the first and second signal couplers may be formed from first and third metallization layers on a stacked dielectric substrate, where the signal path is formed from a second metallization layer. additional signal couplers may be coupled to the signal path for concurrently measuring additional reference planes.
