20240015970. THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)

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THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME

Organization Name

Samsung Electronics Co., Ltd.

Inventor(s)

Woosung Yang of Gwangmyeong-si (KR)

HOJUN Seong of Suwon-si (KR)

JOONHEE Lee of Seongnam-si (KR)

JOON-SUNG Lim of Seongnam-si (KR)

EUNTAEK Jung of Seongnam-si (KR)

THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240015970 titled 'THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME

Simplified Explanation

The disclosed patent application describes a semiconductor memory device that includes multiple layers and structures for improved performance and functionality. Here is a simplified explanation of the abstract:

  • The semiconductor memory device consists of a first substrate and a second substrate, with a lower semiconductor layer and an upper semiconductor layer on the first substrate.
  • On top of the upper semiconductor layer, there is an electrode structure composed of multiple stacked electrodes.
  • A vertical channel structure is present, which penetrates the electrode structure and connects to the second substrate.
  • An interlayer dielectric layer covers the electrode structure, providing insulation.
  • A cutting structure is included, which penetrates both the interlayer dielectric layer and the upper semiconductor layer.
  • The cutting structure defines a first sidewall on the upper semiconductor layer.
  • The lower semiconductor layer has a second sidewall adjacent to the first sidewall.
  • The first sidewall and the second sidewall are horizontally offset from each other.

Potential applications of this technology:

  • Memory devices: The semiconductor memory device can be used in various memory applications, such as computer systems, smartphones, and other electronic devices.
  • Data storage: The improved performance and functionality of the device can enhance data storage capabilities, allowing for larger and faster storage capacities.
  • Integrated circuits: The device can be integrated into complex integrated circuits, enabling advanced functionality in electronic systems.

Problems solved by this technology:

  • Improved performance: The multiple layers and structures in the device enhance its performance, including faster data access and higher storage capacities.
  • Space efficiency: The vertical channel structure and stacked electrodes allow for a more compact design, saving space in electronic devices.
  • Enhanced reliability: The cutting structure and offset sidewalls provide better insulation and reduce the risk of electrical interference or leakage.

Benefits of this technology:

  • Higher memory capacity: The device's improved design allows for larger memory capacities, accommodating the increasing demand for data storage.
  • Faster data access: The enhanced performance of the device enables faster data retrieval and processing, improving overall system speed.
  • Space-saving design: The compact design of the device saves valuable space in electronic devices, allowing for more efficient and smaller form factors.


Original Abstract Submitted

disclosed is a semiconductor memory device comprising a second substrate on a first substrate and including a lower semiconductor layer and an upper semiconductor layer on the lower semiconductor layer, an electrode structure on the upper semiconductor layer and including a plurality of stacked electrodes, a vertical channel structure that penetrates the electrode structure and is connected to the second substrate, an interlayer dielectric layer that covers the electrode structure, and a cutting structure that penetrates the interlayer dielectric layer and the upper semiconductor layer. the upper semiconductor layer has a first sidewall defined by the cutting structure. the lower semiconductor layer has a second sidewall adjacent to the first sidewall. the first sidewall and the second sidewall are horizontally offset from each other.