20240015704. FR2 TYPE 1 UL GAP CONFIGURATION IN DYNAMIC TDD SYSTEM simplified abstract (Apple Inc.)
FR2 TYPE 1 UL GAP CONFIGURATION IN DYNAMIC TDD SYSTEM
Organization Name
Inventor(s)
Huaning Niu of Cupertino CA (US)
Dawei Zhang of Cupertino CA (US)
Manasa Raghavan of Cupertino CA (US)
Sharad Sambhwani of San Diego CA (US)
Xiang Chen of Cupertino CA (US)
Yang Tang of Cupertino CA (US)
FR2 TYPE 1 UL GAP CONFIGURATION IN DYNAMIC TDD SYSTEM - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240015704 titled 'FR2 TYPE 1 UL GAP CONFIGURATION IN DYNAMIC TDD SYSTEM
Simplified Explanation
The patent application discloses systems and methods for implementing uplink (UL) gaps to facilitate user equipment (UE) calibration in time division duplex (TDD) communication. The UE determines slot patterns of a slot configuration that is repeated during TDD communication with a base station. The UE also determines a UL gap periodicity, which defines periods covering an integer number of repetitions of the slot configuration. The UE then performs UE calibration during semi-persistently configured UL slots of a period of the UL gap periodicity that correspond to UL indications in common configuration, dedicated configuration, and/or slot format indication (SFI) downlink control information (DCI) for the slot patterns of the slot configuration. The patent application also discusses methods of identifying particular semi-persistently configured UL slots of a period to use for the UL gap, excluding UL slot indications from dynamic DCI for UL gap purposes.
- The patent application describes a method for UE calibration during TDD communication with a base station.
- The UE determines slot patterns and a UL gap periodicity for the slot configuration.
- UE calibration is performed during semi-persistently configured UL slots of a period that correspond to UL indications in common configuration, dedicated configuration, and/or SFI DCI.
- The patent application also discusses methods of identifying specific semi-persistently configured UL slots to use for the UL gap.
- UL slot indications from dynamic DCI are not used for UL gap purposes.
Potential Applications
- This technology can be applied in TDD communication systems to facilitate UE calibration.
- It can be used in various industries that rely on TDD communication, such as telecommunications, wireless networking, and IoT.
Problems Solved
- The patent application addresses the problem of UE calibration during TDD communication.
- It solves the challenge of determining specific UL slots for UE calibration within a slot configuration.
- The technology eliminates the use of UL slot indications from dynamic DCI for UL gap purposes.
Benefits
- The systems and methods described in the patent application enable efficient and accurate UE calibration in TDD communication.
- By using semi-persistently configured UL slots, the technology ensures that UE calibration is performed during specific periods of the UL gap periodicity.
- The exclusion of UL slot indications from dynamic DCI helps optimize the use of UL gaps for calibration purposes.
Original Abstract Submitted
systems and methods for implementing uplink (ul) gaps to facilitate user equipment (ue) calibration are disclosed herein. a ue determines one or more slot patterns of a slot configuration that is repeated during time division duplex (tdd) communication with a base station. the ue determines a ul gap periodicity (defining periods covering an integer number of repetitions of the slot configuration). the ue then performs ue calibration during one or more semi-persistently configured ul slots of a period of the ul gap periodicity that correspond to ul indication(s) in one or more of a common configuration, a dedicated configuration, and/or a slot format indication (sfi) downlink control information (dci) for the slot pattern(s) of the slot configuration. methods of identifying particular semi-persistently configured ul slots of a period to use for the ul gap are also discussed. ul slot indications from dynamic dci are not used for ul gap purposes.
