20240009760. PROCESSING DEVICE AND METHOD simplified abstract (4JET microtech GmbH)

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PROCESSING DEVICE AND METHOD

Organization Name

4JET microtech GmbH

Inventor(s)

[[:Category:Dennis V�ll of Nideggen (DE)|Dennis V�ll of Nideggen (DE)]][[Category:Dennis V�ll of Nideggen (DE)]]

PROCESSING DEVICE AND METHOD - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240009760 titled 'PROCESSING DEVICE AND METHOD

Simplified Explanation

The abstract describes a method for processing a workpiece and generating a marking in a specific processing position. The method involves determining the measuring position of the marking in a different coordinate system by measuring the marking. A mapping is then defined using the processing position and the measuring position, which allows for mapping a position in the measuring coordinate system onto a position in the processing coordinate system.

  • The method involves processing a workpiece and generating a marking in a specific processing position.
  • The measuring position of the marking is determined by measuring the marking.
  • A mapping is defined using the processing position and the measuring position.
  • The mapping allows for mapping a position in the measuring coordinate system onto a position in the processing coordinate system.

Potential Applications:

  • This method can be applied in various industries where precise processing and measurement of workpieces are required, such as manufacturing, engineering, and quality control.
  • It can be used in machining processes to ensure accurate positioning and alignment of workpieces.
  • The method can also be utilized in laser cutting, engraving, or marking applications to ensure precise and consistent results.

Problems Solved:

  • The method solves the problem of accurately determining the measuring position of a marking in a different coordinate system.
  • It addresses the challenge of mapping positions between different coordinate systems, allowing for seamless integration of processing and measurement data.

Benefits:

  • The method enables precise and accurate processing of workpieces by ensuring proper alignment and positioning.
  • It improves efficiency and reduces errors by automating the mapping process between different coordinate systems.
  • The method enhances quality control by providing a reliable and consistent method for measuring and mapping positions.
  • It can save time and resources by eliminating the need for manual calculations and adjustments in processing and measurement tasks.


Original Abstract Submitted

disclosed is a method comprising: processing a workpiece in a processing position and thereby generating a marking in the processing position, the processing position being defined by coordinates in a processing coordinate system; determining a measuring position of the marking in a measuring coordinate system by measuring the marking; defining a mapping using the processing position and the measuring position, wherein the mapping maps a position in the measuring coordinate system onto a position in the processing coordinate system.

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