18546161. Circuit, Device and Method for Optical Characteristic Inspection simplified abstract (NIPPON TELEGRAPH AND TELEPHONE CORPORATION)
Contents
- 1 Circuit, Device and Method for Optical Characteristic Inspection
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 Circuit, Device and Method for Optical Characteristic Inspection - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
Circuit, Device and Method for Optical Characteristic Inspection
Organization Name
NIPPON TELEGRAPH AND TELEPHONE CORPORATION
Inventor(s)
Yoshiho Maeda of Musashino-shi, Tokyo (JP)
Toru Miura of Musashino-shi, Tokyo (JP)
Hiroshi Fukuda of Musashino-shi, Tokyo (JP)
Circuit, Device and Method for Optical Characteristic Inspection - A simplified explanation of the abstract
This abstract first appeared for US patent application 18546161 titled 'Circuit, Device and Method for Optical Characteristic Inspection
Simplified Explanation
The optical characteristic inspection circuit described in the patent application includes an optical input element, an optical splitter circuit with a resistor, two optical circuits to be inspected, and a photodetector to measure light intensity.
- Optical characteristic inspection circuit with optical input element, splitter circuit, and photodetector.
- First and second optical circuits connected to the splitter circuit for inspection.
- Photodetector measures light intensity through each optical circuit for inspection.
Potential Applications
The technology can be applied in industries where optical characteristic inspection is required, such as manufacturing, quality control, and research and development.
Problems Solved
The circuit reduces the man-hours required for optical characteristic inspection, making the process more efficient and cost-effective.
Benefits
The circuit provides a reliable and accurate method for inspecting optical characteristics, leading to improved product quality and performance.
Potential Commercial Applications
The technology can be used in the production of optical devices, electronic components, and other products that require precise optical characteristics.
Possible Prior Art
One possible prior art could be optical inspection systems used in manufacturing processes to ensure product quality and consistency.
Unanswered Questions
How does the optical splitter circuit improve the efficiency of the inspection process?
The optical splitter circuit allows for simultaneous inspection of two optical circuits, reducing the time and resources needed for inspection.
What are the specific industries that can benefit from this optical characteristic inspection circuit?
Industries such as telecommunications, semiconductor manufacturing, and medical devices can benefit from the improved efficiency and accuracy of optical characteristic inspection provided by this circuit.
Original Abstract Submitted
An optical characteristic inspection circuit includes, in order, an optical input element, an optical splitter circuit including a resistor, a first optical circuit to be inspected connected to one output of the optical splitter circuit, a second optical circuit to be inspected connected to another output of the optical splitter circuit, and a photodetector that detects an intensity of light transmitted through the first optical circuit to be inspected and an intensity of light transmitted through the second optical circuit to be inspected. Therefore, the present invention can provide an optical characteristic inspection circuit capable of reducing man-hours required for optical characteristic inspection.
