18545851. ELECTROSTATIC DISCHARGE CIRCUIT AND METHOD OF OPERATING SAME simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
Contents
- 1 ELECTROSTATIC DISCHARGE CIRCUIT AND METHOD OF OPERATING SAME
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 ELECTROSTATIC DISCHARGE CIRCUIT AND METHOD OF OPERATING SAME - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Unanswered Questions
- 1.11 Original Abstract Submitted
ELECTROSTATIC DISCHARGE CIRCUIT AND METHOD OF OPERATING SAME
Organization Name
Taiwan Semiconductor Manufacturing Company, Ltd.
Inventor(s)
ELECTROSTATIC DISCHARGE CIRCUIT AND METHOD OF OPERATING SAME - A simplified explanation of the abstract
This abstract first appeared for US patent application 18545851 titled 'ELECTROSTATIC DISCHARGE CIRCUIT AND METHOD OF OPERATING SAME
Simplified Explanation
The abstract describes an electrostatic discharge (ESD) circuit with detection, discharging, and assist circuits to protect nodes from ESD events.
- The first ESD detection circuit monitors voltage between two nodes.
- The first discharging circuit includes a transistor to discharge the first node.
- The first ESD assist circuit clamps the voltage at the third node during an ESD event.
Potential Applications
The technology can be applied in electronic devices, integrated circuits, and semiconductor manufacturing to protect against ESD damage.
Problems Solved
1. Protection against electrostatic discharge events. 2. Safeguarding sensitive electronic components from damage.
Benefits
1. Improved reliability of electronic devices. 2. Increased lifespan of integrated circuits. 3. Enhanced performance of semiconductor devices.
Potential Commercial Applications
Protective circuits for smartphones, computers, automotive electronics, and other electronic devices.
Possible Prior Art
Prior art may include existing ESD protection circuits in the semiconductor industry.
Unanswered Questions
How does the circuit respond to multiple ESD events in quick succession?
The circuit's ability to handle multiple ESD events rapidly is not addressed in the abstract. Further details on this aspect would be beneficial for a comprehensive understanding of the technology.
What is the impact of the ESD assist circuit on overall circuit performance?
The abstract does not delve into the potential effects of the ESD assist circuit on the performance of the overall circuit. Understanding any trade-offs or limitations introduced by this component would be valuable for evaluating the technology.
Original Abstract Submitted
An electrostatic discharge (ESD) circuit includes a first ESD detection circuit, a first discharging circuit and a first ESD assist circuit. The first ESD detection circuit is coupled between a first node having a first voltage and a second node having a second voltage. The first discharging circuit includes a first transistor. The first transistor has a first gate, a first drain, a first source and a first body terminal. The first gate is coupled to the first ESD detection circuit by a third node. The first drain is coupled to the first node. The first source and the first body terminal are coupled together at the second node. The first ESD assist circuit is coupled between the second and third node, and configured to clamp a third voltage of the third node at the second voltage during an ESD event at the first or second node.
