18543121. DETECTION METHOD, ELECTRONIC DEVICE AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM simplified abstract (BOE Technology Group Co., Ltd.)

From WikiPatents
Jump to navigation Jump to search

DETECTION METHOD, ELECTRONIC DEVICE AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM

Organization Name

BOE Technology Group Co., Ltd.

Inventor(s)

Yongzhang Liu of Beijing (CN)

Zhaoyue Li of Beijing (CN)

Dong Chai of Beijing (CN)

Hong Wang of Beijing (CN)

DETECTION METHOD, ELECTRONIC DEVICE AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM - A simplified explanation of the abstract

This abstract first appeared for US patent application 18543121 titled 'DETECTION METHOD, ELECTRONIC DEVICE AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM

Simplified Explanation

The present disclosure provides a detection method for identifying defects in images using a pre-constructed detection model.

  • Detection method for identifying defects in images:
   * Input an image to be detected into a pre-constructed detection model.
   * Detect the image to identify any defects.
   * The detection model includes a defect classification identification sub-model.
   * The sub-model is configured to classify defects in the image using base models and a secondary model.

Potential applications of this technology: - Quality control in manufacturing processes - Medical imaging for identifying anomalies or abnormalities - Security systems for detecting unauthorized access or threats

Problems solved by this technology: - Efficient and accurate defect detection in images - Streamlining quality control processes - Enhancing security measures through image analysis

Benefits of this technology: - Improved accuracy in defect classification - Faster detection and response to potential issues - Enhanced overall quality control in various industries

Potential commercial applications of this technology:

      1. Improving Quality Control Processes with Advanced Defect Detection Technology

Possible prior art: - Traditional image processing techniques for defect detection - Manual inspection methods for identifying defects in images

Unanswered questions:

      1. How does this detection method compare to other existing defect identification technologies?

- Answer: This detection method utilizes a pre-constructed model with base models and a secondary model to classify defects in images, potentially offering a more efficient and accurate solution compared to traditional methods.

      1. What industries could benefit the most from implementing this defect detection technology?

- Answer: Industries such as manufacturing, healthcare, and security could benefit significantly from the implementation of this defect detection technology to enhance quality control, medical imaging, and security measures.


Original Abstract Submitted

The present disclosure provides a detection method. The detection method includes inputting an image to be detected into a detection model being pre-constructed and detecting the image to be detected. The detection model includes a defect classification identification sub-model configured to identify a classification of a defect in the image to be detected, and the defect classification identification sub-model comprises a plurality of base models and a secondary model. The present disclosure further provides an electronic device and a non-transitory computer-readable storage medium.