18518249. CONTAMINATION DETECTION APPARATUS simplified abstract (DENSO CORPORATION)
Contents
- 1 CONTAMINATION DETECTION APPARATUS
CONTAMINATION DETECTION APPARATUS
Organization Name
Inventor(s)
Yasuhiro Suzuki of Kariya-city (JP)
CONTAMINATION DETECTION APPARATUS - A simplified explanation of the abstract
This abstract first appeared for US patent application 18518249 titled 'CONTAMINATION DETECTION APPARATUS
Simplified Explanation
The contamination detection apparatus described in the patent application acquires information from a laser radar apparatus to detect contamination of an optical window. Here are some key points to explain the innovation:
- Acquires distance-measurement point information and light reception intensity from a laser radar apparatus.
- Acquires scattered light information from a scattered light sensor detecting scattered light generated by laser light scattering inside the casing.
- Executes contamination detection based on scattered light intensity to detect contamination of the optical window.
- Prohibits contamination detection when light reception intensity is equal to or greater than a set intensity threshold based on the distance-measurement point distance.
Potential Applications
The technology can be applied in various industries where contamination detection of optical windows is crucial, such as automotive, aerospace, and manufacturing.
Problems Solved
This technology solves the problem of efficiently detecting contamination on optical windows, ensuring optimal performance and safety of equipment.
Benefits
The contamination detection apparatus provides a reliable and accurate method for detecting contamination, leading to improved maintenance and operational efficiency.
Potential Commercial Applications
The technology can be commercialized for use in laser radar systems, surveillance equipment, and other optical devices requiring contamination detection.
Possible Prior Art
One possible prior art could be contamination detection systems using different sensor technologies or methods for detecting contamination on optical surfaces.
Unanswered Questions
How does the contamination detection apparatus handle different types of contaminants on the optical window?
The patent application does not specify how the apparatus distinguishes between different types of contaminants or if it can detect specific types of contaminants.
What is the impact of environmental factors on the accuracy of contamination detection by the apparatus?
The patent application does not address how environmental conditions such as temperature, humidity, or external light sources may affect the accuracy of contamination detection.
Original Abstract Submitted
A contamination detection apparatus acquires distance-measurement point information from a laser radar apparatus that generates the distance-measurement point information that indicates a distance-measurement point distance to a distance measurement point and light reception intensity of detected laser light. The contamination detection apparatus acquires scattered light information that indicates scattered light intensity of scattered light from a scattered light sensor that detects scattered light generated by the laser light scattering inside the casing as a result of emission of the laser light by the laser radar apparatus. The contamination detection apparatus executes contamination detection that detects contamination of the optical window based on the scattered light intensity indicated by the scattered light information. The contamination detection apparatus prohibits execution of the contamination detection when the light reception intensity is equal to or greater than an intensity threshold set based on the distance-measurement point distance corresponding to the light reception intensity.
