18510402. GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DUAL NANORIBBON CHANNEL STRUCTURES simplified abstract (Intel Corporation)
Contents
- 1 GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DUAL NANORIBBON CHANNEL STRUCTURES
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DUAL NANORIBBON CHANNEL STRUCTURES - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Original Abstract Submitted
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DUAL NANORIBBON CHANNEL STRUCTURES
Organization Name
Inventor(s)
Tanuj Trivedi of Hillsboro OR (US)
Rahul Ramaswamy of Portland OR (US)
Jeong Dong Kim of Scappoose OR (US)
Babak Fallahazad of Portland OR (US)
Hsu-Yu Chang of Hillsboro OR (US)
Ting Chang of Portland OR (US)
Nidhi Nidhi of Hillsboro OR (US)
Walid M. Hafez of Portland OR (US)
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DUAL NANORIBBON CHANNEL STRUCTURES - A simplified explanation of the abstract
This abstract first appeared for US patent application 18510402 titled 'GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DUAL NANORIBBON CHANNEL STRUCTURES
Simplified Explanation
The abstract describes gate-all-around integrated circuit structures with dual nanowire/nanoribbon channel structures and methods of fabricating them. The structure includes two vertical arrangements of nanowires, with a dielectric cap over the first arrangement and the second arrangement staggered laterally with the first arrangement and the dielectric cap.
- Dual nanowire/nanoribbon channel structures in gate-all-around integrated circuit
- Two vertical arrangements of nanowires
- Dielectric cap over the first arrangement
- Second arrangement staggered laterally with the first arrangement and the dielectric cap
Potential Applications
The technology can be applied in:
- Advanced semiconductor devices
- High-performance integrated circuits
- Nanoelectronics
Problems Solved
This technology addresses:
- Enhanced performance and efficiency of integrated circuits
- Improved scalability of semiconductor devices
- Increased functionality of nanoelectronics
Benefits
The benefits of this technology include:
- Higher speed and lower power consumption in integrated circuits
- Greater control and precision in semiconductor device fabrication
- Enhanced capabilities in nanoelectronics research and development
Potential Commercial Applications
Optimizing SEO: Potential Commercial Applications of Dual Nanowire/Nanoribbon Channel Structures in Gate-All-Around Integrated Circuits
Some questions that are not answered by this article are:
== What are the specific materials used in fabricating these dual nanowire/nanoribbon channel structures? Answer: The article does not provide information on the specific materials used in the fabrication process.
== How does the performance of integrated circuits with dual nanowire/nanoribbon channel structures compare to traditional structures? Answer: The article does not discuss the performance comparison between circuits with dual nanowire/nanoribbon channel structures and traditional structures.
Original Abstract Submitted
Gate-all-around integrated circuit structures having dual nanowire/nanoribbon channel structures, and methods of fabricating gate-all-around integrated circuit structures having dual nanowire/nanoribbon channel structures, are described. For example, an integrated circuit structure includes a first vertical arrangement of nanowires above a substrate. A dielectric cap is over the first vertical arrangement of nanowires. A second vertical arrangement of nanowires is above the substrate. Individual ones of the second vertical arrangement of nanowires are laterally staggered with individual ones of the first vertical arrangement of nanowires and the dielectric cap.
- Intel Corporation
- Tanuj Trivedi of Hillsboro OR (US)
- Rahul Ramaswamy of Portland OR (US)
- Jeong Dong Kim of Scappoose OR (US)
- Babak Fallahazad of Portland OR (US)
- Hsu-Yu Chang of Hillsboro OR (US)
- Ting Chang of Portland OR (US)
- Nidhi Nidhi of Hillsboro OR (US)
- Walid M. Hafez of Portland OR (US)
- H01L29/423
- H01L21/02
- H01L29/06
- H01L29/10
- H01L29/165
- H01L29/66