18467235. Inertial Measurement Device simplified abstract (SEIKO EPSON CORPORATION)

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Inertial Measurement Device

Organization Name

SEIKO EPSON CORPORATION

Inventor(s)

Taketo Chino of Hokuto (JP)

Yoshiyuki Matsuura of Shiojiri (JP)

Inertial Measurement Device - A simplified explanation of the abstract

This abstract first appeared for US patent application 18467235 titled 'Inertial Measurement Device

Simplified Explanation

The patent application describes an inertial measurement device that includes a board, a first inertial sensor detecting a physical quantity of a first axis, a rigid case covering the sensor, and a filling material between the sensor and the case.

  • The device includes a board for support and structure.
  • A first inertial sensor is positioned perpendicular to the board to detect physical quantities along a specific axis.
  • A rigid case is used to cover and protect the first inertial sensor.
  • A filling material is placed between the sensor and the case for added protection and stability.

Potential Applications

This technology could be used in:

  • Motion tracking systems
  • Virtual reality devices
  • Robotics for movement detection

Problems Solved

This technology helps solve:

  • Accurate measurement of physical quantities
  • Protection of sensitive sensors from external factors

Benefits

The benefits of this technology include:

  • Improved accuracy in measuring physical quantities
  • Enhanced durability and protection for sensors

Potential Commercial Applications

A potential commercial application for this technology could be:

  • Inertial measurement systems for sports performance analysis

Possible Prior Art

One possible prior art for this technology could be:

  • Inertial measurement devices used in aerospace industry for navigation purposes

Unanswered Questions

How does this technology compare to existing inertial measurement devices on the market?

This article does not provide a direct comparison to existing devices.

Are there any limitations to the use of this technology in certain environments or conditions?

This article does not address any limitations that may exist for the technology.


Original Abstract Submitted

An inertial measurement device includes: a board; a first inertial sensor configured to detect a physical quantity of a first axis and disposed perpendicular to the board; a rigid case configured to cover the first inertial sensor; and a filling material disposed between the first inertial sensor and the case.