18448262. Method and device for optimizing an amount of testing with respect to a total test time simplified abstract (Robert Bosch GmbH)
Method and device for optimizing an amount of testing with respect to a total test time
Organization Name
Inventor(s)
Sebastian Bayer of Schoenaich (DE)
Michel Janus of Kirchentellinsfurt (DE)
Method and device for optimizing an amount of testing with respect to a total test time - A simplified explanation of the abstract
This abstract first appeared for US patent application 18448262 titled 'Method and device for optimizing an amount of testing with respect to a total test time
Simplified Explanation
The patent application describes a method for reducing the amount of testing required by optimizing a cost function based on test variables associated with each test.
- The method involves using a binary matrix and optimizing a cost function dependent on test variables.
- Each test in the testing process is associated with a test variable that determines its relevance.
- The cost function includes constraints such as ensuring the result of a matrix/vector multiplication is greater than or equal to a vector of ones.
- The binary matrix is subtracted to obtain the vector for the matrix/vector multiplication, with the entries representing the test variables.
- Another constraint is that the test variables must be binary.
Potential applications of this technology:
- Quality assurance in software development
- Streamlining testing processes in manufacturing
- Improving efficiency in medical testing procedures
Problems solved by this technology:
- Reducing time and resources required for testing
- Ensuring relevant tests are prioritized
- Minimizing errors in testing procedures
Benefits of this technology:
- Cost savings through reduced testing requirements
- Faster time to market for products
- Improved accuracy and reliability in testing processes
Original Abstract Submitted
A method is for determining a reduced first amount of testing from a second amount of testing. The method includes provision of a binary matrix, and optimization of a cost function, which is dependent on test variables. Each of test of the second amount of testing is associated with a test variable, and the test variable characterizes whether the test is relevant. The cost function defines constraints: a first constraint is defined in that a result of a matrix/vector multiplication must be greater than or equal to a vector comprising only ones. The matrix of the matrix/vector multiplication is a matrix whose entries all have the value one. The entries of the binary matrix are subtracted, and the vector of matrix/vector multiplication is a vector comprising the test variables. A second constraint is defined in that the test variables are binary.
