18364802. SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

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SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SAME

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Yeongseon Kim of Suwon-si (KR)

Dohyun Kim of Suwon-si (KR)

Juhyeon Kim of Suwon-si (KR)

Hyoeun Kim of Suwon-si (KR)

Seonkyung Seo of Suwon-si (KR)

Chajea Jo of Suwon-si (KR)

SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SAME - A simplified explanation of the abstract

This abstract first appeared for US patent application 18364802 titled 'SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SAME

Simplified Explanation

  • A semiconductor package consists of two semiconductor chips bonded together with a bonding structure.
  • The bonding structure includes a first bonding pad, a first bonding insulating layer, a second bonding pad in contact with the first bonding pad, and a second bonding insulating layer in contact with the first bonding insulating layer.
  • The first bonding pad contains a first pad metal layer and a first conductive barrier layer surrounding the first pad metal layer, with a horizontal extension portion extending on an edge of the upper surface of the first pad metal layer.

Potential Applications

  • Integrated circuits
  • Electronic devices
  • Semiconductor manufacturing

Problems Solved

  • Improved bonding structure between semiconductor chips
  • Enhanced electrical connectivity
  • Increased reliability of semiconductor packages

Benefits

  • Higher performance of semiconductor devices
  • Better thermal management
  • Increased durability and longevity of semiconductor packages


Original Abstract Submitted

A semiconductor package includes a first semiconductor chip including a first semiconductor device, a second semiconductor chip including a second semiconductor device, and a bonding structure between the first and second semiconductor chips, the bonding structure including a first bonding pad, a first bonding insulating layer, a second bonding pad in contact with the first bonding pad, and a second bonding insulating layer in contact with the first bonding insulating layer. The first bonding pad may include a first pad metal layer and a first conductive barrier layer surrounding the first pad metal layer, and the first conductive barrier layer may include a horizontal extension portion extending on an edge of an upper surface of the first pad metal layer.