18345130. SEMICONDUCTOR DEVICES simplified abstract (Samsung Electronics Co., Ltd.)

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SEMICONDUCTOR DEVICES

Organization Name

Samsung Electronics Co., Ltd.

Inventor(s)

Chul Kim of Suwon-si (KR)

Yeondo Jung of Suwon-si (KR)

Gwirim Park of Suwon-si (KR)

Yelin Lee of Suwon-si (KR)

Kichul Kim of Suwon-si (KR)

Kyungin Choi of Suwon-si (KR)

SEMICONDUCTOR DEVICES - A simplified explanation of the abstract

This abstract first appeared for US patent application 18345130 titled 'SEMICONDUCTOR DEVICES

Simplified Explanation

The semiconductor device described in the patent application includes:

  • Channels spaced apart on a substrate in a vertical direction
  • Gate structure on the substrate bordering lower and upper surfaces and a first sidewall of the channels
  • Source/drain layer on a portion of the substrate adjacent to the gate structure and contacting second sidewalls of the channels
  • Nitrogen-containing portion formed at an upper portion of the channels, possibly doped with nitrogen

Potential applications of this technology:

  • Improved performance and efficiency of semiconductor devices
  • Enhanced control over electron flow in the channels
  • Increased reliability and longevity of the semiconductor device

Problems solved by this technology:

  • Minimizing leakage current in semiconductor devices
  • Enhancing the speed and functionality of electronic devices
  • Improving the overall performance of integrated circuits

Benefits of this technology:

  • Higher performance and efficiency in semiconductor devices
  • Better control and management of electron flow
  • Increased reliability and longevity of electronic devices


Original Abstract Submitted

A semiconductor device includes channels spaced apart from each other on a substrate in a vertical direction substantially perpendicular to an upper surface of the substrate, a gate structure on the substrate and bordering lower and upper surfaces and a first sidewall of at least a portion of each of the channels, and a source/drain layer on a portion of the substrate adjacent to the gate structure and contacting second sidewalls of the channels. A nitrogen-containing portion is formed at an upper portion of an uppermost one of the channels, and may be doped with nitrogen.