18341021. Inertial Sensor Module And Inertial Measurement System simplified abstract (SEIKO EPSON CORPORATION)
Inertial Sensor Module And Inertial Measurement System
Organization Name
Inventor(s)
Shinichi Mitsunaga of Shiojiri (JP)
Inertial Sensor Module And Inertial Measurement System - A simplified explanation of the abstract
This abstract first appeared for US patent application 18341021 titled 'Inertial Sensor Module And Inertial Measurement System
Simplified Explanation
The abstract describes an inertial sensor module that includes two inertial sensors and a processing device. The processing device receives detection signals from the inertial sensors and output measurement data based on these signals and external instruction information. The measurement data is output in a format determined by external format selection information.
- The patent describes an inertial sensor module with two inertial sensors and a processing device.
- The processing device receives detection signals from the inertial sensors and external instruction information.
- Based on these signals and instruction information, the processing device outputs measurement data.
- The measurement data is output in a format determined by external format selection information.
Potential Applications
- Motion tracking in virtual reality or augmented reality systems.
- Navigation systems in autonomous vehicles.
- Fitness tracking devices for monitoring movement and activity.
Problems Solved
- Provides accurate measurement data based on detection signals from multiple inertial sensors.
- Allows for customization of the output format based on external selection information.
Benefits
- Improved accuracy in motion tracking and navigation systems.
- Flexibility in output format to meet specific requirements.
- Enhanced performance and functionality of fitness tracking devices.
Original Abstract Submitted
An inertial sensor module includes: a first inertial sensor; a second inertial sensor; and a processing device configured to receive a first detection signal output from the first inertial sensor and a second detection signal output from the second inertial sensor, and output measurement data based on the first detection signal and the second detection signal and based on output instruction information received from outside. The processing device is configured to output the measurement data in a format corresponding to output format selection information received from the outside.
