18340407. 3D FERROELECTRIC MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

From WikiPatents
Jump to navigation Jump to search

3D FERROELECTRIC MEMORY DEVICE

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Jinseong Heo of Suwon-si (KR)

Taehwan Moon of Suwon-si (KR)

Seunggeol Nam of Suwon-si (KR)

Hyunjae Lee of Suwon-si (KR)

3D FERROELECTRIC MEMORY DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 18340407 titled '3D FERROELECTRIC MEMORY DEVICE

Simplified Explanation

The abstract describes a 3D ferroelectric memory device consisting of multiple stacked gate electrodes, ferroelectric layers, intermediate electrodes, insulating layers, and a channel layer.

  • The device includes gate electrodes stacked on a substrate in one direction.
  • Ferroelectric layers are placed on the gate electrodes in another direction.
  • Intermediate electrodes are added on the ferroelectric layers in the same direction as the ferroelectric layers.
  • A first insulating layer is placed between the gate electrodes and the intermediate electrodes.
  • A second insulating layer is added on top of the intermediate electrodes and the first insulating layer.
  • A channel layer is placed on the second insulating layer.

Potential applications of this technology:

  • Memory devices: The 3D ferroelectric memory device can be used in various memory applications due to its stacked structure and ferroelectric properties.
  • Data storage: The device can be utilized for storing and retrieving data in electronic devices, providing high-density storage capabilities.
  • Non-volatile memory: The ferroelectric memory device can retain stored data even when power is turned off, making it suitable for non-volatile memory applications.

Problems solved by this technology:

  • Increased storage capacity: The 3D structure allows for stacking multiple layers, increasing the memory capacity of the device.
  • Improved data retention: The ferroelectric layers provide enhanced data retention capabilities, ensuring stored information is preserved for longer periods.
  • Reduced power consumption: The non-volatile nature of the memory device reduces the need for constant power supply, resulting in lower power consumption.

Benefits of this technology:

  • High-density storage: The stacked structure and ferroelectric layers enable the device to achieve high-density data storage, maximizing storage capacity.
  • Improved performance: The use of ferroelectric materials enhances the device's performance by providing faster read and write operations.
  • Energy efficiency: The non-volatile nature and reduced power consumption contribute to energy-efficient operation, prolonging battery life in portable devices.


Original Abstract Submitted

Provided is a 3D ferroelectric memory device. The 3D ferroelectric memory device may include a plurality of gate electrodes stacked on a substrate in a first direction; a plurality of ferroelectric layers on the plurality of gate electrodes in a second direction; a plurality of intermediate electrodes on the plurality of ferroelectric layers in the second direction; a first insulating layer between the plurality of gate electrodes and between the plurality of intermediate electrodes; a second insulating layer on the plurality of intermediate electrodes and the first insulating layer; and a channel layer on the second insulating layer.