18339567. METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE simplified abstract (SEIKO EPSON CORPORATION)

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METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

Organization Name

SEIKO EPSON CORPORATION

Inventor(s)

Koichi Mizugaki of Suwa-shi (JP)

Tomoyuki Kamakura of Matsumoto-shi (JP)

Yasuke Matsuzawa of Chino-shi (JP)

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 18339567 titled 'METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

Simplified Explanation

The patent application describes a method for manufacturing a semiconductor device. Here is a simplified explanation of the abstract:

  • The method starts by creating a hole that goes through the semiconductor substrate.
  • An insulating film is then formed on the surface of the substrate and the side of the hole.
  • A resist is applied on the surface of the insulating film, covering the substrate surface and the side of the hole.
  • The insulating film is wet-etched using the resist as a mask.
  • An organic insulating film is then applied to cover the substrate surface and the side of the hole.
  • Finally, a conductive film is formed on the surface of the organic insulating film.

Potential applications of this technology:

  • Manufacturing of various semiconductor devices such as transistors, diodes, and integrated circuits.
  • Production of high-performance electronic components used in computers, smartphones, and other electronic devices.

Problems solved by this technology:

  • Provides a method for creating a through hole in a semiconductor substrate.
  • Enables the formation of insulating and conductive films on the substrate surface and the side of the hole.
  • Offers a simplified and efficient manufacturing process for semiconductor devices.

Benefits of this technology:

  • Allows for the creation of complex semiconductor structures with improved functionality.
  • Enhances the reliability and performance of semiconductor devices.
  • Provides a cost-effective manufacturing method for producing high-quality semiconductor components.


Original Abstract Submitted

A method for manufacturing a semiconductor device includes: forming a first through hole penetrating from a first surface to a second surface of a semiconductor substrate; forming a second insulating film at the first surface of the semiconductor substrate and a side surface of the first through hole; disposing a resist at a surface of the second insulating film from the first surface of the semiconductor substrate to an end portion of the side surface of the first through hole on a first surface side of the semiconductor substrate; wet-etching the second insulating film by using the resist as a mask; covering the first surface of the semiconductor substrate and the side surface of the first through hole with an organic insulating film; and forming a second conductive film at a surface of the organic insulating film.