18338569. SCAN DRIVER AND DISPLAY DEVICE INCLUDING THE SAME simplified abstract (Samsung Display Co., Ltd.)

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SCAN DRIVER AND DISPLAY DEVICE INCLUDING THE SAME

Organization Name

Samsung Display Co., Ltd.

Inventor(s)

KI NYENG Kang of YONGIN-SI (KR)

GUANGHAI Jin of YONGIN-SI (KR)

SUNKWANG Kim of YONGIN-SI (KR)

SCAN DRIVER AND DISPLAY DEVICE INCLUDING THE SAME - A simplified explanation of the abstract

This abstract first appeared for US patent application 18338569 titled 'SCAN DRIVER AND DISPLAY DEVICE INCLUDING THE SAME

Simplified Explanation

The abstract describes a method of manufacturing a semiconductor device that involves designing a semiconductor device layout using a design rule manual (DRM), performing failure evaluation, updating the DRM based on the evaluation results, redesigning the layout, and manufacturing the device.

  • Designing semiconductor device layout using a design rule manual (DRM)
  • Performing failure evaluation of the manufactured semiconductor device
  • Updating the DRM based on failure evaluation results
  • Redesigning the semiconductor device layout using the updated DRM
  • Manufacturing the semiconductor device using the redesigned layout

Potential Applications

This technology can be applied in the semiconductor industry for improving the design and manufacturing process of semiconductor devices.

Problems Solved

1. Enhances the efficiency of semiconductor device manufacturing process 2. Helps in identifying and rectifying failures in the design phase

Benefits

1. Improved quality control in semiconductor device manufacturing 2. Reduction in design flaws and failures 3. Enhanced overall performance of semiconductor devices

Potential Commercial Applications

Optimizing Semiconductor Device Manufacturing Process

Possible Prior Art

Prior art in the semiconductor industry may include various methods and techniques used for designing and manufacturing semiconductor devices.

Unanswered Questions

How does this method compare to existing techniques in terms of cost-effectiveness?

The article does not provide a direct comparison with existing techniques in terms of cost-effectiveness.

What specific types of failures can be identified and addressed using this method?

The article does not specify the specific types of failures that can be identified and addressed using this method.


Original Abstract Submitted

A method of manufacturing a semiconductor device includes designing a semiconductor device layout using a design rule manual (DRM), in which design rules are recorded, and performing failure evaluation of a failure including at least one gate structure failure of a semiconductor device manufactured using the designed semiconductor device layout. The method further includes updating the DRM by updating the design rules recorded in the DRM, based on a result of the failure evaluation, redesigning the semiconductor device layout using the updated DRM, and manufacturing the semiconductor device using the redesigned semiconductor device layout.