18312811. METHOD OF FABRICATING SEMICONDUCTOR DEVICE simplified abstract (Samsung Electronics Co., Ltd.)

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METHOD OF FABRICATING SEMICONDUCTOR DEVICE

Organization Name

Samsung Electronics Co., Ltd.

Inventor(s)

Eun Hyea Ko of Suwon-si (KR)

Hoon Han of Suwon-si (KR)

Byung Keun Hwang of Suwon-si (KR)

Young Hun Sung of Suwon-si (KR)

Youn Joung Cho of Suwon-si (KR)

METHOD OF FABRICATING SEMICONDUCTOR DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 18312811 titled 'METHOD OF FABRICATING SEMICONDUCTOR DEVICE

Simplified Explanation

The method of fabricating a semiconductor device involves:

  • Forming a first layer with a metal material and no acid.
  • Forming a second layer with a trench exposing the first surface, containing an acid and organic material.
  • Providing a first precursor with an alkoxy group and silicon.
  • Forming a third layer of silicon oxide on the second surface within the trench, in contact with a portion of the first surface.

Potential applications of this technology:

  • Semiconductor manufacturing
  • Electronics industry

Problems solved by this technology:

  • Improving semiconductor device fabrication process
  • Enhancing performance and reliability of semiconductor devices

Benefits of this technology:

  • Increased efficiency in semiconductor fabrication
  • Better quality control in device manufacturing
  • Enhanced functionality of semiconductor devices


Original Abstract Submitted

Provided is a method of fabricating a semiconductor device. The method of fabricating a semiconductor device comprises forming a first layer which has a first surface, does not comprise an acid, and comprises a metal material; forming, on the first layer, a second layer which comprises a trench exposing the first surface, has a second surface intersecting the first surface within the trench, and comprises an acid and an organic material; providing a first precursor comprising an alkoxy group and silicon; and forming a third layer comprising silicon oxide on the second surface within the trench. The third layer is in contact with a portion of the first surface within the trench.