18249351. METHOD AND DEVICE FOR PRODUCING A SEMICONDUCTOR COMPONENT simplified abstract (Robert Bosch GmbH)

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METHOD AND DEVICE FOR PRODUCING A SEMICONDUCTOR COMPONENT

Organization Name

Robert Bosch GmbH

Inventor(s)

Daniel Monteiro Diniz Reis of Esslingen Am Neckar (DE)

Frank Schatz of Kornwestheim (DE)

Mathias Mews of Reutlingen (DE)

Timo Schary of Aichtal-Neuenhaus (DE)

METHOD AND DEVICE FOR PRODUCING A SEMICONDUCTOR COMPONENT - A simplified explanation of the abstract

This abstract first appeared for US patent application 18249351 titled 'METHOD AND DEVICE FOR PRODUCING A SEMICONDUCTOR COMPONENT

Simplified Explanation

The patent application describes a device and method for producing a semiconductor component. The method involves arranging a dielectric layer between two electrodes of the semiconductor component, which contains defects of a specific type. The process includes determining the time period required for the defects to move into a desired position within the dielectric layer and determining the voltage necessary for this movement. The first voltage is then applied between the electrodes during the specified time period.

  • The method involves arranging a dielectric layer between two electrodes of a semiconductor component.
  • Defects of a specific type are present in the dielectric layer.
  • The time period required for the defects to move into a desired position within the dielectric layer is determined.
  • The voltage necessary for the movement of the defects is determined.
  • The determined voltage is applied between the electrodes during the specified time period.

Potential Applications

  • Manufacturing of semiconductor components
  • Improving the performance and reliability of semiconductor devices

Problems Solved

  • Addressing defects in the dielectric layer of semiconductor components
  • Enhancing the functionality and efficiency of semiconductor devices

Benefits

  • Improved quality and reliability of semiconductor components
  • Enhanced performance and functionality of semiconductor devices
  • Increased efficiency in the manufacturing process


Original Abstract Submitted

A device and method for producing a semiconductor component. The method includes: arranging a dielectric layer between a first electrode and a second electrode of the semiconductor component, there being defects of a first defect type in the dielectric layer; determining a time period for movement of defects of the first defect type into a target position in the dielectric layer; determining a first voltage for the movement of said defects in the dielectric layer; applying the first voltage between the first electrode and the second electrode in the time period.