18242094. MAGNETIC FIELD MEASUREMENT APPARATUS simplified abstract (NEC Corporation)

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MAGNETIC FIELD MEASUREMENT APPARATUS

Organization Name

NEC Corporation

Inventor(s)

Kenta Matsumoto of Tokyo (JP)

MAGNETIC FIELD MEASUREMENT APPARATUS - A simplified explanation of the abstract

This abstract first appeared for US patent application 18242094 titled 'MAGNETIC FIELD MEASUREMENT APPARATUS

Simplified Explanation

The magnetic field measurement apparatus described in the patent application includes a gas cell containing an alkali metal atom, a light generation device for generating light with controlled polarization, an optical frequency modulation device, a light detection device for measuring light intensity and polarization, and a control device for determining magnetic field values based on the measured light properties.

  • Gas cell with encapsulated alkali metal atom
  • Light generation device for generating light with controlled polarization
  • Optical frequency modulation device for modulating light frequency
  • Light detection device for measuring light intensity and polarization
  • Control device for determining magnetic field values

Potential Applications

The technology can be used in various fields such as:

  • Magnetic field mapping
  • Magnetic resonance imaging
  • Navigation systems
  • Geophysical surveys

Problems Solved

The apparatus provides a precise and accurate method for measuring magnetic fields, overcoming limitations of traditional techniques.

Benefits

  • High sensitivity and accuracy
  • Non-invasive measurement
  • Real-time monitoring capabilities

Potential Commercial Applications

Advanced Magnetic Field Measurement Technology for Various Industries This technology can be applied in industries such as:

  • Aerospace
  • Defense
  • Healthcare
  • Research and development

Unanswered Questions

How does the apparatus handle external interference in magnetic field measurements?

What is the cost-effectiveness of implementing this technology compared to existing methods?

Original Abstract Submitted

A magnetic field measurement apparatus according to the present invention includes: a gas cell in which an alkali metal atom is encapsulated; a light generation device configured to generate light to be radiated to the gas cell while controlling a polarization state thereof; an optical frequency modulation device configured to modulate a frequency of the light generated by the light generation device; a light detection device configured to measure an intensity and a polarization state of light transmitted through the gas cell; and a control device configured to determine a magnetic field value at a predetermined position inside the gas cell based on each of the intensity of the light and the polarization state of the light measured by the light detection device.