18239140. SEMICONDUCTOR MEMORY DEVICE HAVING MEMORY CHIP BONDED TO A CMOS CHIP INCLUDING A PERIPHERAL CIRCUIT simplified abstract (Kioxia Corporation)
SEMICONDUCTOR MEMORY DEVICE HAVING MEMORY CHIP BONDED TO A CMOS CHIP INCLUDING A PERIPHERAL CIRCUIT
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SEMICONDUCTOR MEMORY DEVICE HAVING MEMORY CHIP BONDED TO A CMOS CHIP INCLUDING A PERIPHERAL CIRCUIT - A simplified explanation of the abstract
This abstract first appeared for US patent application 18239140 titled 'SEMICONDUCTOR MEMORY DEVICE HAVING MEMORY CHIP BONDED TO A CMOS CHIP INCLUDING A PERIPHERAL CIRCUIT
Simplified Explanation
The patent application describes a memory device with multiple memory cells and sense amplifiers arranged in a specific configuration.
- The memory device includes multiple memory cells provided above a substrate.
- Each memory cell is connected to a corresponding bit line that extends in a first direction.
- Sense amplifiers are used to sense the voltage of each bit line.
- The sense amplifiers are arranged in groups, with the first and second sense amplifiers belonging to the first group and the third sense amplifier belonging to the second group.
- The first and second sense amplifiers are adjacent to each other and arranged in a second direction that intersects the first direction.
- The first and second sense amplifier groups are adjacent to each other and arranged in the first direction.
Potential applications of this technology:
- Memory devices used in various electronic devices such as computers, smartphones, and tablets.
- Data storage systems in cloud computing and data centers.
- Embedded memory in microcontrollers and other integrated circuits.
Problems solved by this technology:
- Efficient sensing of the voltage in multiple bit lines.
- Improved organization and arrangement of sense amplifiers for better performance and reliability.
- Reduction of signal interference and crosstalk between adjacent bit lines.
Benefits of this technology:
- Higher memory density and capacity.
- Faster and more reliable data access and retrieval.
- Improved overall performance and efficiency of memory devices.
- Enhanced signal integrity and reduced noise interference.
Original Abstract Submitted
A memory device includes a first memory cell provided above a substrate; a first bit line coupled to the first memory cell and extending in a first direction; a first sense amplifier configured to sense a voltage of the first bit line; a second memory cell provided above the substrate; a second bit line adjacent to the first bit line and extending in the first direction, the second bit line being coupled to the second memory cell; a second sense amplifier configured to sense a voltage of the second bit line; and a third memory cell provided above the substrate. A third bit line not adjacent to the second bit line extends in the first direction, and is coupled to the third memory cell; and a third sense amplifier is configured to sense a voltage of the third bit line. The first and second sense amplifiers belong to a first sense amplifier group, are adjacent to each other and are arranged in a second direction intersecting the first direction. The third sense amplifier belongs to a second sense amplifier group. The first and second sense amplifier groups are adjacent to each other and are arranged in the first direction.