18219232. SEMICONDUCTOR DEVICE simplified abstract (Samsung Electronics Co., Ltd.)

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SEMICONDUCTOR DEVICE

Organization Name

Samsung Electronics Co., Ltd.

Inventor(s)

Jaehyun Lim of Suwon-si (KR)

Subin Kim of Suwon-si (KR)

Jiwon Oh of Suwon-si (KR)

Jinho Park of Suwon-si (KR)

Joongwon Jeon of Suwon-si (KR)

SEMICONDUCTOR DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 18219232 titled 'SEMICONDUCTOR DEVICE

Simplified Explanation

The semiconductor device described in the abstract includes a substrate with first and second regions, active fins extending in different directions on each region, an isolation pattern between the regions, and gate structures on the active fins with varying widths.

  • The semiconductor device has a substrate with distinct regions for different components.
  • Active fins extend in different directions on each region to optimize performance.
  • An isolation pattern separates the regions to prevent interference.
  • Gate structures on the active fins have varying widths for specific functionality.

Potential Applications

This technology could be applied in:

  • High-performance computing
  • Mobile devices
  • Internet of Things (IoT) devices

Problems Solved

This technology addresses:

  • Interference between components
  • Optimization of performance
  • Space efficiency in semiconductor design

Benefits

The benefits of this technology include:

  • Improved performance
  • Enhanced functionality
  • Space-saving design

Potential Commercial Applications

This technology could be commercially applied in:

  • Semiconductor manufacturing
  • Electronics industry
  • Research and development

Possible Prior Art

One possible prior art for this technology could be the use of gate structures with varying widths in semiconductor devices to optimize performance and functionality.

Unanswered Questions

How does this technology compare to existing semiconductor designs in terms of performance and efficiency?

This article does not provide a direct comparison with existing semiconductor designs to evaluate performance and efficiency.

What are the potential challenges in implementing this technology on a large scale in semiconductor manufacturing?

This article does not address the potential challenges in scaling up the implementation of this technology in semiconductor manufacturing processes.


Original Abstract Submitted

A semiconductor device includes a substrate including first and second regions; a first active fin extending in a first direction on the first region; a second active fin extending in the first direction on the second region; an isolation pattern on the substrate between the first and second regions; a first gate structure on the first active fin, extending in a second direction perpendicular to the first direction, and onto an upper surface of the isolation pattern; and a second gate structure on the second active fin, extending in the second direction, and onto the upper surface of the isolation pattern, wherein the first gate structure includes a first portion having a first width and a second portion having a second width that is less than the first width, and the second gate structure includes a third portion having the first width and a fourth portion having the second width.