18211456. METHOD OF MEASURING THICKNESS OF DISPLAY DEVICE simplified abstract (Samsung Display Co., LTD.)
METHOD OF MEASURING THICKNESS OF DISPLAY DEVICE
Organization Name
Inventor(s)
Sang Heon Ye of Yongin-si (KR)
METHOD OF MEASURING THICKNESS OF DISPLAY DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18211456 titled 'METHOD OF MEASURING THICKNESS OF DISPLAY DEVICE
Simplified Explanation
The method described in the patent application involves measuring the thickness of an organic layer in a display device by scanning external light to a photo sensing pixel and comparing the measured thickness with the sensing value.
- Acquiring a sensing value by scanning external light to a photo sensing pixel of the display device
- Measuring an organic layer thickness at a tag part of the display device
- Comparing the measured thickness with the sensing value
Potential Applications
This technology can be applied in the manufacturing process of display devices to ensure the quality and accuracy of the organic layer thickness.
Problems Solved
This technology solves the problem of accurately measuring the thickness of an organic layer in a display device without the need for complex and expensive equipment.
Benefits
- Improved quality control in the manufacturing process of display devices
- Cost-effective method for measuring organic layer thickness
- Enhanced efficiency in production processes
Original Abstract Submitted
A method of measuring a thickness of a display device according to an embodiment includes: acquiring a sensing value by scanning external light to a photo sensing pixel of the display device; and measuring an organic layer thickness at a tag part of the display device and comparing the measured thickness with the sensing value.
