18181087. FAILURE DIAGNOSIS METHOD, METHOD OF MANUFACTURING DISK DEVICE, AND RECORDING MEDIUM simplified abstract (TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION)

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FAILURE DIAGNOSIS METHOD, METHOD OF MANUFACTURING DISK DEVICE, AND RECORDING MEDIUM

Organization Name

TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION

Inventor(s)

Yoshinari Higashino of Chigasaki Kanagawa (JP)

FAILURE DIAGNOSIS METHOD, METHOD OF MANUFACTURING DISK DEVICE, AND RECORDING MEDIUM - A simplified explanation of the abstract

This abstract first appeared for US patent application 18181087 titled 'FAILURE DIAGNOSIS METHOD, METHOD OF MANUFACTURING DISK DEVICE, AND RECORDING MEDIUM

Simplified Explanation

The abstract describes a failure diagnosis method involving installing a disk device in a manufacturing rack, acquiring data on a predetermined constituent unit's state, and determining if it falls within an allowable range.

  • Disk device installed in manufacturing rack
  • Acquires data on state of predetermined constituent unit
  • Determines if state falls within allowable range

Potential Applications

This technology could be applied in various industries where monitoring and diagnosing the state of constituent units within a manufacturing rack is crucial, such as:

  • Data centers
  • Manufacturing plants
  • Industrial facilities

Problems Solved

This technology helps in:

  • Identifying potential failures in constituent units
  • Preventing downtime by addressing issues proactively

Benefits

The benefits of this technology include:

  • Improved maintenance efficiency
  • Increased equipment reliability
  • Cost savings through proactive maintenance

Potential Commercial Applications

The technology could be commercially applied in:

  • Equipment monitoring systems
  • Maintenance service providers
  • Industrial automation solutions

Possible Prior Art

One possible prior art could be traditional manual inspection methods used in manufacturing facilities to diagnose failures in constituent units.

Unanswered Questions

How does the failure diagnosis method handle real-time data acquisition?

The abstract does not specify the frequency or method of data acquisition for monitoring the state of the constituent unit in real-time.

What are the specific parameters used to determine the allowable range for the state of the constituent unit?

The abstract does not detail the specific criteria or thresholds used to define the allowable range for the state of the constituent unit.


Original Abstract Submitted

According to an embodiment, there is provided a failure diagnosis method. The failure diagnosis method includes installing a disk device in a manufacturing rack. The failure diagnosis method acquiring, by the disk device, data on a state of a predetermined constituent unit in the manufacturing rack with the disk device being installed in the manufacturing rack. The failure diagnosis method includes determining, by the disk device, whether or not the state of the predetermined constituent unit falls within an allowable range by using the data acquired.