18180716. SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE simplified abstract (Mitsubishi Electric Corporation)

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SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

Organization Name

Mitsubishi Electric Corporation

Inventor(s)

Kohei Sako of Tokyo (JP)

Yuji Ebiike of Tokyo (JP)

Kazuya Inoue of Tokyo (JP)

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 18180716 titled 'SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

Simplified Explanation

The semiconductor device described in the abstract includes a semiconductor layer with a trench, a buried electrode, an upper electrode, an insulating film, a first electrode, and a second electrode. The insulating film has three portions and the upper electrode has a dent in the central portion.

  • Semiconductor layer with trench
  • Buried electrode inside the trench
  • Upper electrode inside the trench
  • Insulating film with three portions
  • First electrode on the upper surface
  • Second electrode on the lower surface
  • Dent in the central portion of the upper electrode

Potential Applications

This technology could be used in:

  • Power electronics
  • Semiconductor devices
  • Integrated circuits

Problems Solved

This technology helps in:

  • Improving device performance
  • Enhancing reliability
  • Reducing power consumption

Benefits

The benefits of this technology include:

  • Higher efficiency
  • Better thermal management
  • Increased durability

Potential Commercial Applications

This technology could be applied in:

  • Consumer electronics
  • Automotive industry
  • Renewable energy sector

Possible Prior Art

One possible prior art for this technology could be:

  • Semiconductor devices with buried electrodes and insulating films

Unanswered Questions

How does the dent in the central portion of the upper electrode affect device performance?

The dent in the upper electrode may impact the electrical characteristics of the device, but the specific effects are not detailed in the abstract.

What materials are used in the insulating film to achieve the three different portions?

The abstract does not specify the materials used in the insulating film to create the three different portions.


Original Abstract Submitted

A semiconductor device according to an aspect of the present disclosure, includes a semiconductor layer in which a trench is formed, a buried electrode provided inside the trench, an upper electrode provided above the buried electrode inside the trench, an insulating film provided inside the trench, a first electrode provided on an upper surface of the semiconductor layer, and a second electrode provided on a lower surface of the semiconductor layer, wherein the insulating film includes a first portion between the buried electrode and a side wall of the trench, a second portion between the upper electrode and the side wall of the trench, and a third portion between the buried electrode and the upper electrode, and a lower surface of the upper electrode has a dent in a central portion.