18179538. INSPECTION SYSTEM, INSPECTION METHOD, AND STORAGE MEDIUM simplified abstract (KABUSHIKI KAISHA TOSHIBA)

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INSPECTION SYSTEM, INSPECTION METHOD, AND STORAGE MEDIUM

Organization Name

KABUSHIKI KAISHA TOSHIBA

Inventor(s)

Daiki Yoda of Yokohama Kanagawa (JP)

Hiroki Mori of Kawasaki Kanagawa (JP)

Tomoya Tandai of Ota Tokyo (JP)

Akira Moriya of Kawasaki Kanagawa (JP)

Ryota Sekiya of Kamakura Kanagawa (JP)

INSPECTION SYSTEM, INSPECTION METHOD, AND STORAGE MEDIUM - A simplified explanation of the abstract

This abstract first appeared for US patent application 18179538 titled 'INSPECTION SYSTEM, INSPECTION METHOD, AND STORAGE MEDIUM

Simplified Explanation

The patent application describes an inspection system that includes an estimation device and a detection device. The estimation device estimates an inspection range where a predetermined object may be present, while the detection device generates detection information regarding the presence of the object in the inspection range.

  • Estimation device: Estimates an inspection range with a possibility of a predetermined object being present.
  • Detection device: Generates detection information on whether the predetermined object is present in the inspection range.

Potential Applications

This technology could be applied in security systems, quality control processes, and automated inspections in various industries.

Problems Solved

This technology helps in efficiently identifying the presence of specific objects within a given inspection range, reducing the need for manual inspection and improving accuracy.

Benefits

- Increased efficiency in inspections - Enhanced accuracy in detecting specific objects - Potential for automation in inspection processes

Potential Commercial Applications

"Automated Object Detection System for Industrial Inspections"

Possible Prior Art

There may be prior art related to automated inspection systems using estimation and detection devices, but specific examples are not provided in the abstract.

Unanswered Questions

How does the estimation device determine the likelihood of the predetermined object being present in the inspection range?

The abstract does not provide details on the specific methodology used by the estimation device to estimate the presence of the predetermined object.

What types of predetermined objects can be detected by the inspection system?

The abstract does not specify the range or types of objects that can be detected by the system.


Original Abstract Submitted

According to one embodiment, an inspection system includes an estimation device and a detection device. The estimation device is configured to estimate an inspection range having a possibility that a predetermined object is present. The detection device is configured to generate detection information as to whether or not the predetermined object is present in the inspection range.