18176292. DATA ANALYSIS APPARATUS, DATA ANALYSIS METHOD, AND STORAGE MEDIUM simplified abstract (KABUSHIKI KAISHA TOSHIBA)
Contents
- 1 DATA ANALYSIS APPARATUS, DATA ANALYSIS METHOD, AND STORAGE MEDIUM
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 DATA ANALYSIS APPARATUS, DATA ANALYSIS METHOD, AND STORAGE MEDIUM - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Unanswered Questions
- 1.11 Original Abstract Submitted
DATA ANALYSIS APPARATUS, DATA ANALYSIS METHOD, AND STORAGE MEDIUM
Organization Name
Inventor(s)
Jumpei Ando of Yokohama Kanagawa (JP)
Takayuki Itoh of Kawasaki kanagawa (JP)
Keisuke Kawauchi of Kawasaki kanagawa (JP)
Toshiyuki Ono of Kawasaki kanagawa (JP)
DATA ANALYSIS APPARATUS, DATA ANALYSIS METHOD, AND STORAGE MEDIUM - A simplified explanation of the abstract
This abstract first appeared for US patent application 18176292 titled 'DATA ANALYSIS APPARATUS, DATA ANALYSIS METHOD, AND STORAGE MEDIUM
Simplified Explanation
The data analysis apparatus described in the patent application computes index values based on manufacturing conditions data to determine the contribution of each condition to abnormalities in products.
- The apparatus acquires first factor data related to manufacturing conditions of a first product and second factor data related to manufacturing conditions of a second product.
- It computes index values for each manufacturing condition to assess their contribution to abnormalities.
- The apparatus then calculates the similarity between the index values for the two products.
Potential Applications
This technology could be applied in various industries such as manufacturing, quality control, and product development to identify and address potential abnormalities in the production process.
Problems Solved
1. Efficiently identifying manufacturing conditions contributing to abnormalities in products. 2. Streamlining the analysis process to improve product quality and reduce defects.
Benefits
1. Enhanced product quality through targeted analysis of manufacturing conditions. 2. Improved efficiency in addressing abnormalities and reducing defects in the production process.
Potential Commercial Applications
Optimizing manufacturing processes, improving product quality control, and reducing defects in various industries such as automotive, electronics, and pharmaceuticals.
Possible Prior Art
One possible prior art could be a similar data analysis system used in the automotive industry to analyze manufacturing conditions and their impact on product quality.
Unanswered Questions
How does the apparatus determine the weight of each manufacturing condition in contributing to abnormalities?
The patent application does not provide specific details on how the apparatus assigns weights to different manufacturing conditions in calculating the index values.
Can the apparatus be integrated with existing quality control systems in manufacturing plants?
The patent application does not mention the compatibility or integration of the data analysis apparatus with existing quality control systems in manufacturing facilities.
Original Abstract Submitted
According to one embodiment, a data analysis apparatus includes processing circuitry. The processing circuitry acquires first factor data indicative of first manufacturing conditions of a first product, and acquires second factor data indicative of second manufacturing conditions of a second product. The processing circuitry computes, based on the first factor data, a first index value relating to a degree by which each of the first manufacturing conditions contributes to an abnormality, and computes, based on the second factor data, a second index value relating to a degree by which each of the second manufacturing conditions contributes to an abnormality. The processing circuitry computes a similarity between the first index value and the second index value.
