18175810. MANUFACTURING DATA ANALYSIS DEVICE AND METHOD simplified abstract (KABUSHIKI KAISHA TOSHIBA)
Contents
- 1 MANUFACTURING DATA ANALYSIS DEVICE AND METHOD
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 MANUFACTURING DATA ANALYSIS DEVICE AND METHOD - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
MANUFACTURING DATA ANALYSIS DEVICE AND METHOD
Organization Name
Inventor(s)
Keisuke Kawauchi of Kawasaki Kanagawa (JP)
Takayuki Itoh of Kawasaki Kanagawa (JP)
Jumpei Ando of Yokohama Kanagawa (JP)
Toshiyuki Ono of Kawasaki Kanagawa (JP)
MANUFACTURING DATA ANALYSIS DEVICE AND METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 18175810 titled 'MANUFACTURING DATA ANALYSIS DEVICE AND METHOD
Simplified Explanation
The manufacturing data analysis device described in the abstract acquires manufacturing data related to multiple products, analyzes the data to determine a relationship between manufacturing conditions and product quality, and generates output data based on the analysis results.
- The device acquires first manufacturing data under a specific acquisition condition, which includes manufacturing condition data and quality data for each product.
- Based on the first manufacturing data, the device determines a different acquisition condition and acquires second manufacturing data under this new condition.
- The device then calculates the relationship between manufacturing condition data and quality data by analyzing the second manufacturing data.
- Finally, the device generates output data that includes the analysis results.
Potential Applications
This technology can be applied in various industries such as manufacturing, quality control, and product development to improve production processes and product quality.
Problems Solved
This technology helps in identifying the impact of manufacturing conditions on product quality, allowing for adjustments to be made to improve overall product performance and customer satisfaction.
Benefits
The benefits of this technology include enhanced quality control, optimized manufacturing processes, and improved product quality, leading to increased customer satisfaction and potentially higher profits.
Potential Commercial Applications
Potential commercial applications of this technology include quality control systems, production optimization tools, and data analysis software for manufacturing companies.
Possible Prior Art
One possible prior art for this technology could be existing data analysis tools used in manufacturing industries to analyze production data and improve product quality.
Unanswered Questions
How does this technology handle large volumes of manufacturing data efficiently?
The abstract does not provide details on the scalability of the device or how it manages and processes large amounts of manufacturing data effectively.
What are the specific parameters used to determine the second acquisition condition?
The abstract does not specify the exact criteria or parameters used by the device to determine the second acquisition condition based on the first manufacturing data.
Original Abstract Submitted
According to one embodiment, a manufacturing data analysis device includes processing circuitry. The processing circuitry acquires, from manufacturing data related to a plurality of products, first manufacturing data under a first acquisition condition. The first manufacturing data includes manufacturing condition data related to a manufacturing condition for each of the products and quality data related to quality for each of the products. The processing circuitry determines a second acquisition condition different from the first acquisition condition based on the first manufacturing data. The processing circuitry acquires second manufacturing data including the manufacturing condition data and the quality data from the manufacturing data under the second acquisition condition. The processing circuitry calculates an analysis result of a relationship between the manufacturing condition data and the quality data by analyzing the second manufacturing data. The processing circuitry generates output data including the analysis result.
