18174008. ANOMALY DETECTION APPARATUS, METHOD, AND STORAGE MEDIUM simplified abstract (KABUSHIKI KAISHA TOSHIBA)

ANOMALY DETECTION APPARATUS, METHOD, AND STORAGE MEDIUM

Organization Name

KABUSHIKI KAISHA TOSHIBA

Inventor(s)

Yasunori Taguchi of Kawasaki Kanagawa (JP)

Kouta Nakata of Tokyo (JP)

Susumu Naito of Yokohama Kanagawa (JP)

Yuichi Kato of Moriya Ibaraki (JP)

Shinya Tominaga of Yokohama Kanagawa (JP)

Naoyuki Takado of Machida Tokyo (JP)

Ryota Miyake of Yokohama Kanagawa (JP)

Yusuke Terakado of Yokohama Kanagawa (JP)

Toshio Aoki of Tokyo (JP)

ANOMALY DETECTION APPARATUS, METHOD, AND STORAGE MEDIUM - A simplified explanation of the abstract

This abstract first appeared for US patent application 18174008 titled 'ANOMALY DETECTION APPARATUS, METHOD, AND STORAGE MEDIUM

Simplified Explanation

The abstract describes an anomaly detection apparatus that uses measured values from sensors to predict values and detect anomalies based on thresholds and consecutive deviations.

• Acquiring measured values, functions, and thresholds from sensors and system.
• Generating predicted values based on measured values and functions.
• Detecting deviations exceeding thresholds.
• Calculating feature quantities based on measured values.
• Determining anomalies based on consecutive deviations exceeding a threshold.

Potential Applications

This technology can be applied in various industries such as manufacturing, healthcare, cybersecurity, and finance for anomaly detection in systems and processes.

Problems Solved

1. Early detection of anomalies in systems. 2. Improving system reliability and performance by identifying issues promptly.

Benefits

1. Increased system efficiency. 2. Reduced downtime and maintenance costs. 3. Enhanced security and data protection.

Potential Commercial Applications

Implementing this technology in predictive maintenance systems for machinery, anomaly detection in medical devices, cybersecurity for network monitoring, and fraud detection in financial transactions.

Possible Prior Art

One possible prior art could be traditional statistical methods for anomaly detection, which may not be as efficient or accurate as the proposed apparatus.

Unanswered Questions

How does the apparatus handle different types of anomalies?

The abstract does not specify how the apparatus distinguishes between different types of anomalies or if it can adapt to new patterns.

What is the processing time for detecting anomalies?

The abstract does not mention the processing time required for the apparatus to detect anomalies in real-time systems.

Original Abstract Submitted

According to one embodiment, an anomaly detection apparatus includes a processing circuit. The processing circuit is configured to: acquire measured values from sensors installed in a system, a first function, a first threshold, and a second function to output a second threshold; generate the predicted values based on the measured value and the first function; detect that a deviation between the measured values and the predicted values exceeds the first threshold; calculate the feature quantities based on the measured values; and determine whether a number of consecutive times is equal to or larger than the second threshold to detect an anomaly or a sign of the anomaly.