18172437. MANUFACTURING DATA ANALYSIS DEVICE, SYSTEM, AND METHOD simplified abstract (KABUSHIKI KAISHA TOSHIBA)
Contents
MANUFACTURING DATA ANALYSIS DEVICE, SYSTEM, AND METHOD
Organization Name
Inventor(s)
Keisuke Kawauchi of Kawasaki Kanagawa (JP)
Takayuki Itoh of Kawasaki Kanagawa (JP)
Jumpei Ando of Yokohama Kanagawa (JP)
Toshiyuki Ono of Kawasaki Kanagawa (JP)
MANUFACTURING DATA ANALYSIS DEVICE, SYSTEM, AND METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 18172437 titled 'MANUFACTURING DATA ANALYSIS DEVICE, SYSTEM, AND METHOD
Simplified Explanation
The manufacturing data analysis device described in the abstract is designed to analyze manufacturing data to determine the influence of various manufacturing conditions on product quality data. Here is a simplified explanation of the abstract:
- The device includes processing circuitry that acquires manufacturing data, which consists of manufacturing condition data and quality data.
- The processing circuitry calculates the influence of specific manufacturing conditions on different pieces of quality data by analyzing the manufacturing data.
- If the calculated influence meets certain conditions, the processing circuitry generates output data related to the manufacturing conditions, quality data affected by those conditions, or the degree of influence itself.
Potential Applications: - Quality control in manufacturing processes - Identifying factors affecting product quality
Problems Solved: - Understanding the impact of manufacturing conditions on product quality - Improving overall product quality through data analysis
Benefits: - Enhanced quality control measures - Increased efficiency in manufacturing processes
Potential Commercial Applications: - Manufacturing industries - Quality assurance companies
Possible Prior Art: - Similar data analysis devices used in manufacturing processes - Quality control systems that analyze manufacturing data
Unanswered Questions: 1. How does the device handle large volumes of manufacturing data for analysis? 2. What specific determination conditions are used to identify significant influences on product quality data?
Original Abstract Submitted
According to one embodiment, a manufacturing data analysis device includes processing circuitry. The processing circuitry acquires manufacturing data including a manufacturing condition data group and a quality data group. The processing circuitry calculates one or more degrees of influence exerted by first manufacturing condition data included in the manufacturing condition data group on respective pieces of quality data included in the quality data group by analyzing the manufacturing data. The processing circuitry, in a case where one or more degrees of influence satisfy a determination condition, generates output data related to at least one of the first manufacturing condition data, one or more pieces of quality data on which the first manufacturing condition data has exerted the degrees of influence satisfying the determination condition, or the degrees of influence satisfying the determination condition.
