18166055. CIRCUIT ANALYSIS METHOD, CIRCUIT ANALYSIS DEVICE, AND CIRCUIT ANALYSIS SYSTEM simplified abstract (Samsung Electronics Co., Ltd.)
CIRCUIT ANALYSIS METHOD, CIRCUIT ANALYSIS DEVICE, AND CIRCUIT ANALYSIS SYSTEM
Organization Name
Inventor(s)
Hyungjung Seo of Suwon-si (KR)
CIRCUIT ANALYSIS METHOD, CIRCUIT ANALYSIS DEVICE, AND CIRCUIT ANALYSIS SYSTEM - A simplified explanation of the abstract
This abstract first appeared for US patent application 18166055 titled 'CIRCUIT ANALYSIS METHOD, CIRCUIT ANALYSIS DEVICE, AND CIRCUIT ANALYSIS SYSTEM
Simplified Explanation
- Circuit analysis method involves building a circuit graph, defining nodes, extracting unknown events, building event nodes, linking event nodes, traversing event graph, identifying source and involvement events, and finding propagation paths.
- Circuit analysis device and system are also provided.
- The method helps in analyzing complex circuits by identifying unknown events and their propagation paths.
Potential Applications
- Electronic circuit design and analysis
- Fault detection and diagnosis in electronic systems
- Signal processing and communication systems
Problems Solved
- Efficient analysis of complex circuits
- Identification of unknown events in the circuit
- Determination of propagation paths for events
Benefits
- Improved accuracy in circuit analysis
- Faster identification of faults in electronic systems
- Enhanced understanding of circuit behavior
Original Abstract Submitted
Provided are a circuit analysis method, a circuit analysis device, and a circuit analysis system. An embodiment provides a circuit analysis method, including: building a circuit graph based on a netlist of a circuit; defining a node in the circuit graph; extracting an X (unknown) event for each node based on a waveform built as a result of simulation for the node; building an X event node from the X event that was extracted; building an X event graph by linking the X event node to at least one other X event node; traversing the X event graph and identifying a source X event and an involvement X event; and finding an X propagation path for the X event node, the X propagation path comprising the source X event and the involvement X event.
