18165447. MAGNETIC PROPERTY MEASURING SYSTEM, A METHOD FOR MEASURING MAGNETIC PROPERTIES, AND A METHOD FOR MANUFACTURING A MAGNETIC MEMORY DEVICE USING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
Contents
- 1 MAGNETIC PROPERTY MEASURING SYSTEM, A METHOD FOR MEASURING MAGNETIC PROPERTIES, AND A METHOD FOR MANUFACTURING A MAGNETIC MEMORY DEVICE USING THE SAME
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 MAGNETIC PROPERTY MEASURING SYSTEM, A METHOD FOR MEASURING MAGNETIC PROPERTIES, AND A METHOD FOR MANUFACTURING A MAGNETIC MEMORY DEVICE USING THE SAME - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Original Abstract Submitted
MAGNETIC PROPERTY MEASURING SYSTEM, A METHOD FOR MEASURING MAGNETIC PROPERTIES, AND A METHOD FOR MANUFACTURING A MAGNETIC MEMORY DEVICE USING THE SAME
Organization Name
Inventor(s)
MAGNETIC PROPERTY MEASURING SYSTEM, A METHOD FOR MEASURING MAGNETIC PROPERTIES, AND A METHOD FOR MANUFACTURING A MAGNETIC MEMORY DEVICE USING THE SAME - A simplified explanation of the abstract
This abstract first appeared for US patent application 18165447 titled 'MAGNETIC PROPERTY MEASURING SYSTEM, A METHOD FOR MEASURING MAGNETIC PROPERTIES, AND A METHOD FOR MANUFACTURING A MAGNETIC MEMORY DEVICE USING THE SAME
Simplified Explanation
The abstract describes a magnetic property measuring system that includes a stage and a magnetic structure. The stage holds a sample and has a body part, a magnetic part, and holes. The magnetic part of the stage and the magnetic structure apply a magnetic field to the sample. The stage can move horizontally in two directions parallel to the sample's surface.
- The system includes a stage that holds a sample and a magnetic structure.
- The stage has a body part, a magnetic part, and holes.
- The magnetic part of the stage and the magnetic structure apply a magnetic field to the sample.
- The stage can move horizontally in the x-direction and y-direction parallel to the sample's surface.
Potential Applications
- Magnetic property measurement of various materials
- Research and development of magnetic devices
- Quality control in manufacturing processes involving magnetic materials
Problems Solved
- Accurate measurement of magnetic properties of samples
- Controlled application of magnetic fields to samples
- Efficient movement of the stage for measurements
Benefits
- Precise and reliable magnetic property measurements
- Versatile system for different types of samples
- Improved efficiency and accuracy in research and manufacturing processes involving magnetic materials
Original Abstract Submitted
A magnetic property measuring system includes a stage configured to hold a sample and a magnetic structure disposed over the stage. The stage includes a body part, a magnetic part adjacent the body part, and a plurality of holes defined in the body part. The magnetic part of the stage and the magnetic structure are configured to apply a magnetic field, which is perpendicular to one surface of the sample, to the sample. The stage is configured to move horizontally in an x-direction and a y-direction which are parallel to the one surface of the sample.
