18156593. MEMORY CELL AND METHOD OF OPERATING THE SAME simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)

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MEMORY CELL AND METHOD OF OPERATING THE SAME

Organization Name

TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.

Inventor(s)

Bo-Feng Young of Hsinchu (TW)

Sai-Hooi Yeong of Hsinchu (TW)

Chao-I Wu of Hsinchu (TW)

Chih-Yu Chang of Hsinchu (TW)

Yu-Ming Lin of Hsinchu (TW)

MEMORY CELL AND METHOD OF OPERATING THE SAME - A simplified explanation of the abstract

This abstract first appeared for US patent application 18156593 titled 'MEMORY CELL AND METHOD OF OPERATING THE SAME

Simplified Explanation

The abstract describes a memory cell that includes a write bit line, a read word line, a write transistor, and a read transistor. The write transistor is connected between the write bit line and a first node, while the read transistor is connected to the write transistor through the first node. The read transistor has a ferroelectric layer, with its drain terminal connected to the read word line and its source terminal connected to a second node. The write transistor is designed to set the stored data value of the memory cell by using a write bit line signal that adjusts the polarization state of the read transistor, which corresponds to the stored data value.

  • Memory cell includes write bit line, read word line, write transistor, and read transistor
  • Write transistor connects write bit line to first node
  • Read transistor connects to write transistor through first node
  • Read transistor has a ferroelectric layer
  • Drain terminal of read transistor connects to read word line
  • Source terminal of read transistor connects to second node
  • Write transistor sets stored data value by adjusting polarization state of read transistor using write bit line signal
  • Polarization state corresponds to stored data value

Potential Applications

  • Memory cells for computer systems
  • Non-volatile memory devices
  • High-density memory storage

Problems Solved

  • Provides a method for setting the stored data value in a memory cell
  • Utilizes a ferroelectric layer to adjust the polarization state of the read transistor

Benefits

  • Allows for efficient and accurate storage of data in memory cells
  • Enables high-density memory storage
  • Provides non-volatile memory capabilities


Original Abstract Submitted

A memory cell includes a write bit line, a read word line, a write transistor, and a read transistor. The write transistor is coupled between the write bit line and a first node. The read transistor is coupled to the write transistor by the first node. The read transistor includes a ferroelectric layer, a drain terminal of the read transistor is coupled to the read word line, and a source terminal of the read transistor is coupled to a second node. The write transistor is configured to set a stored data value of the memory cell by a write bit line signal that adjusts a polarization state of the read transistor. The polarization state corresponds to the stored data value.