18154958. INTEGRATED CIRCUIT HAVING CURRENT DETECTION DEVICE AND OPERATING METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)

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INTEGRATED CIRCUIT HAVING CURRENT DETECTION DEVICE AND OPERATING METHOD THEREOF

Organization Name

Samsung Electronics Co., Ltd.

Inventor(s)

Junsik Park of Suwon-si (KR)

Heesu Kim of Suwon-si (KR)

Kyungsuk Kim of Suwon-si (KR)

Namsu Kim of Suwon-si (KR)

INTEGRATED CIRCUIT HAVING CURRENT DETECTION DEVICE AND OPERATING METHOD THEREOF - A simplified explanation of the abstract

This abstract first appeared for US patent application 18154958 titled 'INTEGRATED CIRCUIT HAVING CURRENT DETECTION DEVICE AND OPERATING METHOD THEREOF

Simplified Explanation

The abstract describes an integrated circuit (IC) that includes a current detection device and an internal circuit. The current detection device generates monitoring information for electrostatic discharge (ESD) events, and the internal circuit receives this information. The current detection device consists of a current sensing circuit with a T-coil that generates an ESD current and an induced voltage corresponding to the current. Multiple detection circuits output a detection signal based on the induced voltage, and a monitoring circuit receives these signals and generates the monitoring information. The detection circuits have different sensitivities to the induced voltage.

  • The IC includes a current detection device and an internal circuit.
  • The current detection device generates monitoring information for ESD events.
  • The current detection device has a current sensing circuit with a T-coil.
  • The T-coil generates an ESD current and an induced voltage.
  • Multiple detection circuits output a detection signal based on the induced voltage.
  • A monitoring circuit receives the detection signals and generates the monitoring information.
  • The detection circuits have different sensitivities to the induced voltage.

Potential Applications

This technology can be applied in various electronic devices and systems that require protection against electrostatic discharge events. Some potential applications include:

  • Integrated circuits and microchips
  • Consumer electronics (smartphones, tablets, laptops)
  • Automotive electronics
  • Industrial control systems
  • Medical devices

Problems Solved

Electrostatic discharge events can cause damage to electronic components and systems. This technology helps solve the following problems:

  • Protection against electrostatic discharge events
  • Early detection and monitoring of ESD events
  • Differentiation of ESD events based on their intensity or sensitivity

Benefits

The use of this technology offers several benefits:

  • Enhanced protection of electronic components against ESD events
  • Early detection and monitoring of ESD events for timely response
  • Differentiation of ESD events based on their intensity or sensitivity
  • Improved reliability and durability of electronic devices and systems


Original Abstract Submitted

An IC includes a pad, a current detection device connected to the pad and configured to generate monitoring information corresponding to an electrostatic discharge (ESD) event, and an internal circuit configured to receive the monitoring information from the current detection device, wherein the current detection device includes a current sensing circuit having a T-coil that is configured to generate an ESD current when the ESD event occurs and is further configured to generate an induced voltage corresponding to the ESD current, a plurality of detection circuits outputting a detection signal based on the induced voltage, and a monitoring circuit configured to receive the detection signal from each of the plurality of detection circuits and configured to generate the monitoring information, wherein the plurality of detection circuits have different sensitivities with respect to the induced voltage.