18152017. BI-DIRECTIONAL SCAN FLIP-FLOP CIRCUIT AND METHOD simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)

BI-DIRECTIONAL SCAN FLIP-FLOP CIRCUIT AND METHOD

Organization Name

Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor(s)

Huaixin Xian of Hsinchu (TW)

Tzu-Ying Lin of Hsinchu (TW)

Liu Han of Hsinchu (TW)

Jerry Chang Jui Kao of Hsinchu (TW)

Qingchao Meng of Hsinchu (TW)

Xiangdong Chen of Hsinchu (TW)

BI-DIRECTIONAL SCAN FLIP-FLOP CIRCUIT AND METHOD - A simplified explanation of the abstract

This abstract first appeared for US patent application 18152017 titled 'BI-DIRECTIONAL SCAN FLIP-FLOP CIRCUIT AND METHOD

Simplified Explanation

The scan flip-flop circuit described in the abstract is a circuit that includes a selection circuit, flip-flop circuit, and drivers that respond to a scan direction signal to control the output signals.

• The selection circuit has two input terminals connected to I/O nodes and responds to the scan direction signal to select signals from the input terminals.
• The flip-flop circuit is connected to the selection circuit and controls the output signal based on the selected input signal.
• The first driver is connected between the flip-flop circuit and the first I/O node, while the second driver is connected between the flip-flop circuit and the second I/O node.
• The drivers output signals based on the flip-flop circuit output signal and the selected input signal from the selection circuit.

Potential Applications

The scan flip-flop circuit can be used in integrated circuits for testing and debugging purposes, where the ability to control and monitor signals is essential.

Problems Solved

This technology solves the problem of efficiently testing and debugging integrated circuits by providing a circuit that can control and monitor signals during the testing process.

Benefits

The benefits of this technology include improved testing efficiency, better signal control, and enhanced debugging capabilities in integrated circuits.

Potential Commercial Applications

One potential commercial application of this technology is in the semiconductor industry for the production of integrated circuits with advanced testing and debugging capabilities.

Possible Prior Art

Prior art in the field of scan flip-flop circuits may include similar circuits used in the design and testing of integrated circuits, as well as related patents on signal control and monitoring circuits.

How does the scan flip-flop circuit improve testing efficiency in integrated circuits?

The scan flip-flop circuit allows for better signal control and monitoring during testing, which can help identify and debug issues more effectively.

What are the specific advantages of using a selection circuit in the scan flip-flop circuit?

The selection circuit enables the circuit to choose between different input signals, providing flexibility in controlling the output signals based on the scan direction signal.

Original Abstract Submitted

A scan flip-flop circuit includes a selection circuit including first and second input terminals coupled to first and second I/O nodes, a flip-flop circuit coupled to the selection circuit, a first driver coupled between the flip-flop circuit and the first I/O node, and a second driver coupled between the flip-flop circuit and the second I/O node. The selection circuit and drivers receive a scan direction signal. In response to a first logic level of the scan direction signal, the selection circuit responds to a first signal received at the first input terminal, and the second driver outputs a second signal responsive to a flip-flop circuit output signal. In response to a second logic level of the scan direction signal, the selection circuit responds to a third signal received at the second input terminal, and the first driver outputs a fourth signal responsive to the flip-flop circuit output signal.