18151959. TEST CIRCUIT AND METHOD simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)

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TEST CIRCUIT AND METHOD

Organization Name

TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.

Inventor(s)

Hsieh-Hung Hsieh of Hsinchu (TW)

Yen-Jen Chen of Hsinchu (TW)

Tzu-Jin Yeh (US)

TEST CIRCUIT AND METHOD - A simplified explanation of the abstract

This abstract first appeared for US patent application 18151959 titled 'TEST CIRCUIT AND METHOD

Simplified Explanation

The abstract describes an integrated circuit (IC) that has multiple pads on its surface. The IC includes an amplifier that receives an AC signal at an input terminal and outputs another AC signal at an output terminal. There are two detection circuits, one connected to the input terminal and the other to the output terminal. These detection circuits generate DC voltages that are sent to specific pads on the IC in response to the AC signals.

  • The IC has multiple pads on its surface.
  • An amplifier receives an AC signal at an input terminal and outputs another AC signal at an output terminal.
  • A first detection circuit generates a first DC voltage in response to the input AC signal and sends it to a specific pad.
  • A second detection circuit generates a second DC voltage in response to the output AC signal and sends it to another specific pad.

Potential Applications

  • This IC technology can be used in various electronic devices that require signal amplification and detection, such as audio amplifiers, communication systems, and sensor circuits.
  • It can be applied in medical devices, such as pacemakers or hearing aids, to amplify and detect signals accurately.

Problems Solved

  • The IC provides a simplified and efficient way to amplify and detect signals, eliminating the need for external components or complex circuitry.
  • It allows for precise detection of AC signals and conversion to DC voltages, enabling further processing or analysis of the signals.

Benefits

  • The IC simplifies the design and manufacturing process of electronic devices by integrating amplification and detection functions into a single chip.
  • It reduces the size and cost of electronic devices by eliminating the need for additional components.
  • The IC provides accurate and reliable signal amplification and detection, improving the overall performance of electronic systems.


Original Abstract Submitted

An IC includes a plurality of pads at a top surface of a semiconductor wafer, an amplifier configured to receive a first AC signal at an input terminal, and output a second AC signal at an output terminal, a first detection circuit coupled to the input terminal and configured to output a first DC voltage to a first pad of the plurality of pads responsive to the first AC signal, and a second detection circuit coupled to the output terminal and configured to output a second DC voltage to a second pad of the plurality of pads responsive to the second AC signal.