18150474. Transistor Gate Structures and Methods of Forming the Same simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)

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Transistor Gate Structures and Methods of Forming the Same

Organization Name

Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor(s)

Chung-Wei Hsu of Baoshan Township (TW)

Kuan-Ting Pan of Taipei City (TW)

Lung-Kun Chu of New Taipei City (TW)

Kuo-Cheng Chiang of Zhubei City (TW)

Chih-Hao Wang of Baoshan Township (TW)

Jia-Ni Yu of New Taipei City (TW)

Transistor Gate Structures and Methods of Forming the Same - A simplified explanation of the abstract

This abstract first appeared for US patent application 18150474 titled 'Transistor Gate Structures and Methods of Forming the Same

Simplified Explanation

The patent application describes a device with nanostructures and gate spacers on a substrate, along with a dielectric wall between them. The gate structure surrounds the nanostructures and fills the areas between the dielectric wall and the nanostructures.

  • The device includes an isolation region on a substrate.
  • There are first and second nanostructures above the isolation region.
  • First and second gate spacers are present on the respective nanostructures.
  • A dielectric wall separates the gate spacers along one direction and the nanostructures along another direction.
  • The gate structure surrounds the nanostructures and fills the areas between the dielectric wall and the nanostructures.

Potential Applications

  • This technology can be used in the development of advanced electronic devices.
  • It may find applications in the field of nanoelectronics and semiconductor industry.

Problems Solved

  • The device provides improved isolation between the nanostructures and gate spacers.
  • It allows for better control and manipulation of the electrical properties of the nanostructures.

Benefits

  • The device offers enhanced performance and functionality in electronic devices.
  • It enables more efficient use of space and resources in the fabrication process.
  • The technology may lead to the development of smaller and more powerful electronic devices.


Original Abstract Submitted

In an embodiment, a device includes: an isolation region on a substrate; first nanostructures above the isolation region; second nanostructures above the isolation region; a first gate spacer on the first nanostructures; a second gate spacer on the second nanostructures; a dielectric wall between the first gate spacer and the second gate spacer along a first direction in a top-down view, the dielectric wall disposed between the first nanostructures and the second nanostructures along a second direction in the top-down view, the first direction perpendicular to the second direction; and a gate structure around the first nanostructures and around the second nanostructures, a first portion of the gate structure filling a first area between the dielectric wall and the first nanostructures, a second portion of the gate structure filling a second area between the dielectric wall and the second nanostructures.