18148810. RESISTOR WITH DOPED REGIONS AND SEMICONDUCTOR DEVICES HAVING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

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RESISTOR WITH DOPED REGIONS AND SEMICONDUCTOR DEVICES HAVING THE SAME

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

WOOCHEOL Shin of Seoul (KR)

MYUNGGIL Kang of Suwon-Si (KR)

MINYI Kim of Hwaseong-Si (KR)

SANGHOON Lee of Seongnam-Si (KR)

RESISTOR WITH DOPED REGIONS AND SEMICONDUCTOR DEVICES HAVING THE SAME - A simplified explanation of the abstract

This abstract first appeared for US patent application 18148810 titled 'RESISTOR WITH DOPED REGIONS AND SEMICONDUCTOR DEVICES HAVING THE SAME

Simplified Explanation

The abstract describes a resistor with a device isolation layer that includes active regions, a buried insulating layer, and an N well region. The N well region surrounds the active regions, the device isolation layer, and the buried insulating layer. The active regions have doped regions with n type impurities.

  • The resistor includes a device isolation layer.
  • It has a first active region and a second active region.
  • It includes a buried insulating layer.
  • It has an N well region surrounding the active regions, device isolation layer, and buried insulating layer.
  • The first active region and second active region have doped regions with n type impurities.

Potential Applications

  • Electronics manufacturing
  • Circuit design
  • Integrated circuits

Problems Solved

  • Provides a resistor with improved device isolation
  • Enhances the performance and reliability of electronic devices

Benefits

  • Better isolation of active regions
  • Increased performance and reliability of resistors
  • Improved functionality of electronic devices


Original Abstract Submitted

A resistor including a device isolation layer is described that includes a first active region and a second active region, a buried insulating layer, and an N well region. The N well region surrounds the first active region, the second active region, the device isolation layer and the buried insulating layer. A first doped region and a second doped region are disposed on the first active region and the second active region. The first doped region and the second doped region are in contact with the N well region and include n type impurities.