18121869. SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)

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SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

Organization Name

Samsung Electronics Co., Ltd.

Inventor(s)

Hyohoon Byeon of Suwon-si (KR)

SUNGKEUN Lim of Suwon-si (KR)

YUYEONG Jo of Suwon-si (KR)

JINYEONG Joe of Suwon-si (KR)

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME - A simplified explanation of the abstract

This abstract first appeared for US patent application 18121869 titled 'SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

Simplified Explanation

The disclosed semiconductor device includes a substrate with an active pattern, a channel pattern consisting of vertically-stacked semiconductor patterns, a source/drain pattern connected to the semiconductor patterns, and a gate electrode on the semiconductor patterns. The gate electrode has a first portion between two adjacent semiconductor patterns, and a gate insulating layer is between the first portion of the gate electrode and the semiconductor patterns. The second semiconductor pattern is located at a higher tier than the first semiconductor pattern, and the first and second semiconductor patterns have different depths of channel recesses.

  • The device includes a substrate with an active pattern, a channel pattern, a source/drain pattern, and a gate electrode.
  • The channel pattern consists of vertically-stacked semiconductor patterns.
  • The gate electrode has a first portion between two adjacent semiconductor patterns.
  • A gate insulating layer is between the first portion of the gate electrode and the semiconductor patterns.
  • The second semiconductor pattern is located at a higher tier than the first semiconductor pattern.
  • The first and second semiconductor patterns have different depths of channel recesses.

Potential applications of this technology:

  • This semiconductor device can be used in various electronic devices such as smartphones, tablets, and computers.
  • It can be utilized in the manufacturing of integrated circuits and microprocessors.
  • The device's unique structure allows for improved performance and efficiency in electronic devices.

Problems solved by this technology:

  • The vertically-stacked semiconductor patterns provide a compact and efficient design, allowing for more functionality in a smaller space.
  • The different depths of channel recesses in the semiconductor patterns enhance the device's performance and power efficiency.
  • The gate insulating layer between the gate electrode and the semiconductor patterns ensures proper insulation and prevents leakage.

Benefits of this technology:

  • The device's compact design allows for smaller and more portable electronic devices.
  • The improved performance and power efficiency contribute to longer battery life and faster processing speeds.
  • The manufacturing method of this device is cost-effective and scalable, making it suitable for mass production.


Original Abstract Submitted

A semiconductor device and a fabrication method thereof are disclosed. The device includes a substrate including an active pattern, a channel pattern on the active pattern, the channel pattern including a plurality of vertically-stacked semiconductor patterns, a source/drain pattern connected to the semiconductor patterns, a gate electrode on the semiconductor patterns, the gate electrode including a first portion interposed between first and second semiconductor patterns, which are two adjacent ones of the semiconductor patterns, and a gate insulating layer interposed between the first portion of the gate electrode and the first and second semiconductor patterns. The second semiconductor pattern is located at a tier higher than the first semiconductor pattern. The first semiconductor pattern includes a first channel recess having a first depth, and the second semiconductor pattern includes a second channel recess having a second depth smaller than the first depth.