18118816. DUAL RESOLUTION SPECTROMETER, AND SPECTROMETRIC MEASUREMENT APPARATUS AND METHOD USING THE SPECTROMETER simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
Contents
- 1 DUAL RESOLUTION SPECTROMETER, AND SPECTROMETRIC MEASUREMENT APPARATUS AND METHOD USING THE SPECTROMETER
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 DUAL RESOLUTION SPECTROMETER, AND SPECTROMETRIC MEASUREMENT APPARATUS AND METHOD USING THE SPECTROMETER - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Original Abstract Submitted
DUAL RESOLUTION SPECTROMETER, AND SPECTROMETRIC MEASUREMENT APPARATUS AND METHOD USING THE SPECTROMETER
Organization Name
Inventor(s)
Younghoon Sohn of Suwon-si (KR)
DUAL RESOLUTION SPECTROMETER, AND SPECTROMETRIC MEASUREMENT APPARATUS AND METHOD USING THE SPECTROMETER - A simplified explanation of the abstract
This abstract first appeared for US patent application 18118816 titled 'DUAL RESOLUTION SPECTROMETER, AND SPECTROMETRIC MEASUREMENT APPARATUS AND METHOD USING THE SPECTROMETER
Simplified Explanation
The abstract describes a dual resolution spectrometer that uses a slit plate to receive light reflected from a measurement target. The light is then directed to a first mirror, which reflects it to a diffraction grating. The diffraction grating disperses the light based on its wavelength and directs light in different wavelength regions to different mirrors. The second mirror reflects light in the first wavelength region to a detector, while the third mirror reflects light in the second wavelength region to the same detector. The detector is able to detect the light in the two wavelength regions with different resolutions.
- The patent describes a dual resolution spectrometer.
- The spectrometer includes a slit plate to receive light from a measurement target.
- The slit plate directs the light to a first mirror.
- The first mirror reflects the light to a diffraction grating.
- The diffraction grating disperses the light based on its wavelength.
- Light in a first wavelength region is directed to a second mirror.
- Light in a second wavelength region is directed to a third mirror.
- The second mirror reflects the light in the first wavelength region to a detector.
- The third mirror reflects the light in the second wavelength region to the same detector.
- The detector is able to detect the light in the two wavelength regions with different resolutions.
Potential Applications
- Spectroscopy
- Material analysis
- Chemical analysis
- Environmental monitoring
Problems Solved
- Dual resolution detection in a single spectrometer
- Efficient separation and detection of different wavelength regions
Benefits
- Simultaneous detection of different wavelength regions
- Improved resolution for each wavelength region
- Compact design
- Cost-effective solution for dual resolution spectroscopy
Original Abstract Submitted
A dual resolution spectrometer includes a slit plate comprising a slit receiving light reflected from a measurement target. The slit plate directs the light reflected from the measurement target to a first mirror. The first mirror reflects light from the slit to a diffraction grating. The diffraction grating disperses light from the first mirror according to a wavelength of the light. The diffraction grating directs light in a first wavelength region to a second mirror and directs light in a second wavelength region to a third mirror. The second mirror reflects the light in the first wavelength region to a detector. The third mirror reflects the light in the second wavelength region to the detector. The detector detects the light in the first wavelength region and the light in the second wavelength region with different resolutions from each other.
