18047820. INSPECTION DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
Contents
INSPECTION DEVICE
Organization Name
Inventor(s)
Shinji Ueyama of Yokohama City (JP)
Harutaka Sekiya of Yokohama City (JP)
Tomoki Onishi of Yokohama City (JP)
INSPECTION DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18047820 titled 'INSPECTION DEVICE
Simplified Explanation
The abstract describes an inspection device that aims to reduce measurement time by using a magnetoresistive random access memory (MRAM) and a gradient magnetic field. The device includes a stage to hold the MRAM and move it, a set of magnets to generate the magnetic field, and multiple line sensors to detect a magneto-optical effect at different locations on the MRAM. An information processor is used to analyze the data from the line sensors, improving throughput.
- The inspection device includes a stage to fix and move the MRAM, allowing for measurements at different locations.
- A gradient magnetic field is generated by a set of magnets, enabling the detection of magneto-optical effects.
- Multiple line sensors are used to detect the magneto-optical effect at different locations on the MRAM.
- An information processor is employed to process the data collected by the line sensors, improving the overall throughput of the device.
Potential Applications
This technology has potential applications in various industries and fields, including:
- Quality control and inspection processes in manufacturing industries.
- Non-destructive testing and evaluation of materials.
- Magnetic field mapping and analysis.
- Research and development of MRAM technology.
Problems Solved
The inspection device addresses the following problems:
- Reducing measurement time by simultaneously detecting magneto-optical effects at multiple locations on the MRAM.
- Improving throughput by processing the data collected from the line sensors.
- Enabling efficient and accurate inspection of MRAM devices.
Benefits
The benefits of this technology are:
- Faster measurement time, leading to increased productivity and efficiency.
- Improved throughput, allowing for more inspections to be performed in a given time frame.
- Enhanced accuracy and reliability in the inspection process.
- Potential cost savings by reducing the need for manual inspection and increasing automation.
Original Abstract Submitted
To reduce a measurement time, an inspection device includes a stage configured to fix a magnetoresistive random access memory (MRAM) to a stage surface and moving the MRAM, a plurality of magnets configured to generate a gradient magnetic, a plurality of line sensors comprising a first line sensor for detecting a magneto-optical effect at a first location of the MRAM and a second line sensor for detecting the magneto-optical effect at a second location that is different from the first location by moving a location of the MRAM within the gradient magnetic field, and an information processor configured to process the magneto-optical effect detected by the plurality of line sensors. Thus, throughput may be improved.
