18033774. METHOD FOR MEASURING ACTUAL AREA OF DEFECT, AND METHOD AND APPARATUS FOR TESTING DISPLAY PANEL simplified abstract (BOE Technology Group Co., Ltd.)

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METHOD FOR MEASURING ACTUAL AREA OF DEFECT, AND METHOD AND APPARATUS FOR TESTING DISPLAY PANEL

Organization Name

BOE Technology Group Co., Ltd.

Inventor(s)

Wangqiang He of Beijing (CN)

Yiwen Ding of Beijing (CN)

Yuanyuan Lu of Beijing (CN)

Dong Chai of Beijing (CN)

Hong Wang of Beijing (CN)

METHOD FOR MEASURING ACTUAL AREA OF DEFECT, AND METHOD AND APPARATUS FOR TESTING DISPLAY PANEL - A simplified explanation of the abstract

This abstract first appeared for US patent application 18033774 titled 'METHOD FOR MEASURING ACTUAL AREA OF DEFECT, AND METHOD AND APPARATUS FOR TESTING DISPLAY PANEL

Simplified Explanation

The patent application describes a method and apparatus for accurately measuring the actual area of a defect in a display panel. This is achieved by acquiring a measurement image of the display panel, determining the area of defect pixels and the size of reference object pixels in the measurement image, and using this information along with the actual size of the reference object to determine the actual area of the defect.

  • The method involves acquiring a measurement image of a display panel with a defect region.
  • The area of defect pixels in the measurement image is determined.
  • The size of reference object pixels in the measurement image is determined.
  • The actual area of the defect in the display panel is determined using the area of defect pixels, size of reference object pixels, and the actual size of the reference object.

Potential Applications

  • Quality control in the manufacturing of display panels.
  • Defect analysis and characterization in display panels.
  • Improving the accuracy of defect measurements in display panels.

Problems Solved

  • Accurately measuring the actual area of defects in display panels.
  • Providing a method to determine the size of reference object pixels in a measurement image.
  • Enhancing the efficiency and reliability of defect analysis in display panels.

Benefits

  • Improved accuracy in measuring defect areas, leading to better quality control.
  • Time and cost savings in defect analysis and characterization.
  • Enhanced efficiency and reliability in the testing of display panels.


Original Abstract Submitted

A method and apparatus for measuring the actual area of a defect, and a method and apparatus for testing a display panel. The method for measuring the actual area of a defect includes: acquiring a measurement image of a display panel, wherein the measurement image has a defect region; according to the measurement image, determining the area of defect pixels of the defect in the measurement image and determining the size of reference object pixels of a reference object in the measurement image; and according to the area of the defect pixels, the size of the reference object pixels and the actual size of the reference object, determining the actual area of the defect in the display panel.

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