18022668. PROCESSING DEVICE, ABNORMALITY DETECTION SYSTEM, ABNORMALITY DETECTION METHOD, AND COMPUTER-READABLE MEDIUM simplified abstract (NEC Corporation)
PROCESSING DEVICE, ABNORMALITY DETECTION SYSTEM, ABNORMALITY DETECTION METHOD, AND COMPUTER-READABLE MEDIUM
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PROCESSING DEVICE, ABNORMALITY DETECTION SYSTEM, ABNORMALITY DETECTION METHOD, AND COMPUTER-READABLE MEDIUM - A simplified explanation of the abstract
This abstract first appeared for US patent application 18022668 titled 'PROCESSING DEVICE, ABNORMALITY DETECTION SYSTEM, ABNORMALITY DETECTION METHOD, AND COMPUTER-READABLE MEDIUM
Simplified Explanation
The processing device described in the patent application is capable of accurately identifying an abnormal part in an object to be measured.
- First, a difference calculation unit calculates the difference between multiple reference point groups.
- Next, a dynamic point group extraction unit identifies a dynamic point group, which represents a change from the reference point groups.
- Then, a second difference calculation unit calculates the difference between an inspection point group and the reference point group to generate a differential point group.
- A point group removal unit removes the dynamic point group from the differential point group.
- Finally, an abnormal part identification unit identifies the abnormal part based on the differential point group without the dynamic point group.
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- Potential Applications
- Quality control in manufacturing processes - Fault detection in machinery and equipment - Structural health monitoring in buildings and infrastructure
- Problems Solved
- Accurate identification of abnormal parts in objects - Efficient detection of changes from reference point groups - Improved measurement accuracy and reliability
- Benefits
- Early detection of abnormalities leads to preventive maintenance - Increased efficiency in identifying faults and defects - Enhanced quality control processes in various industries
Original Abstract Submitted
Provided is a processing device capable of accurately identifying an abnormal part. A processing device () according to the present disclosure includes a first difference calculation unit () that calculates a difference between a plurality of reference point groups, a dynamic point group extraction unit () that extracts a dynamic point group being a point group involving a change from the reference point groups on the basis of a calculation result in the first difference calculation unit (), a second difference calculation unit () that calculates a difference between an inspection point group acquired after the reference point group and the reference point group and generates a differential point group, a point group removal unit () that removes a point group corresponding to the dynamic point group from the differential point group generated in the second difference calculation unit (), and an abnormal part identification unit () that identifies an abnormal part of the object to be measured on the basis of a differential point group from which the point group corresponding to the dynamic point group is removed.
