17960018. METHOD AND APPARATUS FOR PUF GENERATOR CHARACTERIZATION simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)

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METHOD AND APPARATUS FOR PUF GENERATOR CHARACTERIZATION

Organization Name

TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.

Inventor(s)

Shih-Lien Linus Lu of Hsinchu (TW)

METHOD AND APPARATUS FOR PUF GENERATOR CHARACTERIZATION - A simplified explanation of the abstract

This abstract first appeared for US patent application 17960018 titled 'METHOD AND APPARATUS FOR PUF GENERATOR CHARACTERIZATION

Simplified Explanation

The patent application describes a physical unclonable function (PUF) generator circuit and testing method. The method involves verifying the functionality of the PUF generator by writing and reading logical states from multiple bit cells in a PUF cell array.

  • The method determines the number of bit cells that have different output logical states from the preconfigured logical states.
  • If this number is below a predetermined threshold, the method generates two maps using the PUF generator and a masking circuit under different operation conditions.
  • The method then determines the number of bit cells that are stable in one map and unstable in the other map.
  • If this number is zero, the method determines the number of bit cells that are stable in both maps.
  • If this number exceeds a second predetermined threshold, the PUF generator is considered qualified.

Potential applications of this technology:

  • Secure authentication systems
  • Anti-counterfeiting measures
  • Secure key generation for encryption

Problems solved by this technology:

  • Ensures the functionality and reliability of a PUF generator
  • Identifies qualified PUF generators for secure applications

Benefits of this technology:

  • Provides a reliable testing method for PUF generators
  • Enables the use of PUF generators in secure systems
  • Enhances security and prevents unauthorized access or counterfeiting.


Original Abstract Submitted

Disclosed is a physical unclonable function generator circuit and testing method. In one embodiment, a testing method for physical unclonable function (PUF) generator includes: verifying a functionality of a PUF generator by writing preconfigured logical states to and reading output logical states from a plurality of bit cells in a PUF cell array; determining a first number of first bit cells in the PUF cell array, wherein the output logical states of the first bit cells are different from the preconfigured logical states; when the first number of first bit cells is less than a first predetermined number, generating a first map under a first set of operation conditions using the PUF generator and a masking circuit, generating a second map under a second set of operation conditions using the PUF generator and the masking circuit, determining a second number of second bit cells, wherein the second bit cells are stable in the first map and unstable in the second map; when the second number of second bit cells is determined to be zero, determining a third number of third bit cells, wherein the third bit cells are stable in the first map and stable in the second map; and when the third number of third bit cells are greater than a second preconfigured number, the PUF generator is determined as a qualified PUF generator.

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