17956780. PCIE IN BAND DETERMINISTIC PROTOCOL CROSS FEATURE simplified abstract (Western Digital Technologies, Inc.)
Contents
- 1 PCIE IN BAND DETERMINISTIC PROTOCOL CROSS FEATURE
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 PCIE IN BAND DETERMINISTIC PROTOCOL CROSS FEATURE - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
PCIE IN BAND DETERMINISTIC PROTOCOL CROSS FEATURE
Organization Name
Western Digital Technologies, Inc.
Inventor(s)
Pradeep Bandammanavar Paramesh of Shivamogga (IN)
Muthukumar Karuppiah of Tracy CA (US)
PCIE IN BAND DETERMINISTIC PROTOCOL CROSS FEATURE - A simplified explanation of the abstract
This abstract first appeared for US patent application 17956780 titled 'PCIE IN BAND DETERMINISTIC PROTOCOL CROSS FEATURE
Simplified Explanation
The present disclosure involves validating memory devices using NVMe asynchronous event request (AER) and NVMe asynchronous event notification (AEN) instead of debug hardware. This approach eliminates the need for debug HW, reduces FW custom logic, and reduces latency.
- NVMe AER is used to initiate a specific function on a device under test (DUT) and trigger a cross feature (CF) that overlaps in time with the particular function.
- NVMe AEN is utilized to consume, record, and decode firmware events without the need for debug hardware.
- This method reduces the complexity of firmware development and testing, leading to more efficient validation of memory devices.
Potential Applications
The technology can be applied in:
- Memory device manufacturing
- Firmware development and testing
- Data center operations
Problems Solved
- Eliminates the need for expensive debug hardware
- Reduces latency in validating memory devices
- Simplifies firmware development and testing processes
Benefits
- Cost-effective validation of memory devices
- Improved efficiency in firmware development
- Reduced complexity in testing procedures
Potential Commercial Applications
Optimizing Memory Device Validation Using NVMe AER and AEN
Possible Prior Art
There may be prior art related to using NVMe AER and AEN for memory device validation, but specific examples are not provided in this context.
Unanswered Questions
=== How does this technology compare to traditional memory device validation methods using debug hardware? This article does not provide a direct comparison between using NVMe AER and AEN versus traditional methods with debug hardware. Further research or testing may be needed to determine the specific advantages and limitations of each approach.
=== What are the potential challenges in implementing NVMe AER and AEN for memory device validation in different environments? The article does not address potential challenges that may arise when implementing NVMe AER and AEN in various settings. Factors such as compatibility, scalability, and performance in different scenarios could be important considerations that are not discussed in detail here.
Original Abstract Submitted
The present disclosure generally relates to validating memory devices. Rather than using debug hardware (HW) to consume, record, and decode firmware (FW) events, standard non-volatile memory express (NVMe) asynchronous event request (AER) and NVMe asynchronous event notification (AEN) is used. The NVMe AER results in initiating a particular function to be performed by a device under test (DUT) and triggering a cross feature (CF) that should at least partially overlap in time with the particular function. Using NVMe AER and AEN will eliminate the need for debug HW, reduce FW custom logic, and reduce latency.
